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Volumn 69, Issue 4, 2004, Pages

Precise measurement of the lattice spacing of LaB6 standard powder by the x-ray extended range technique using synchrotron radiation

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION; DIFFRACTOMETERS; GONIOMETERS; LANTHANUM COMPOUNDS; LATTICE CONSTANTS; LIGHT ABSORPTION; LIGHT REFRACTION; MATHEMATICAL MODELS; MONOCHROMATORS; REFRACTIVE INDEX; SILICON; SINGLE CRYSTALS; SYNCHROTRON RADIATION; X RAY POWDER DIFFRACTION;

EID: 2942615066     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevA.69.042101     Document Type: Article
Times cited : (20)

References (27)
  • 12
    • 0034341602 scopus 로고    scopus 로고
    • P. J. Mohr and B. N. Taylor, Rev. Mod. Phys. 72, 351 (2000); J. Phys. Chem. Ref. Data 28, 1731 (1999).
    • (1999) J. Phys. Chem. Ref. Data , vol.28 , pp. 1731
  • 13
    • 0001407056 scopus 로고
    • R. D. Deslattes and A. Henins, Phys. Rev. Lett. 31, 972 (1973); R. D. Deslattes, M. Tanaka, G. L. Greene, A. Henins, and E. G. Kessler, Jr., IEEE Trans. Instrum. Meas. IM-36, 166 (1987).
    • (1973) Phys. Rev. Lett. , vol.31 , pp. 972
    • Deslattes, R.D.1    Henins, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.