Accurate determination of X-ray energies using powder diffraction

Radiation Physics and Chemistry

Volumn 75, Issue 11 SPEC. ISS., 2006, Pages 2063-2066

  Rae, N A ^a   Chantler, C T ^a   Tran, C Q ^a   Barnea, Z ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

Powder diffraction; Synchrotron radiation

Indexed keywords

CRYSTAL LATTICES; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DIFFRACTION; PARAMETER ESTIMATION; PARTICLE SIZE ANALYSIS; SILICON; SYNCHROTRON RADIATION; X RAY ANALYSIS;

ENERGY DETERMINATION; POWDER DIFFRACTION; STANDARD REFERENCE POWDERS; X RAY ENERGIES;

X RAYS;

SILICON;

ACCURACY; ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; CRYSTAL STRUCTURE; PARTICLE SIZE; REFERENCE VALUE; SYNCHROTRON; SYNCHROTRON RADIATION; X RAY POWDER DIFFRACTION;

EID: 33750185312     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radphyschem.2005.09.018     Document Type: Article

References (7)

1. Barnea Z., Creigh D.C., Davis T.J., Garrett R.F., Janky S., Stevenson A.W., and Wilkins S.W. The Australian diffractometer at the photon factory. Rev. Sci. Instrum. 63 (1992) 1069 5
2. Chantler C.T., Tran C.Q., Barnea Z., Paterson D., Cookson D.J., and Balaic D.X. X-ray extended-range technique for precision measurement of the X-ray mass attenuation coefficient and Im(f) for copper using synchrotron radiation. Phys. Rev. A 64 (2001) 062506
3. Chantler C.T., Tran C.Q., Barnea Z., Paterson D., and Cookson D.J. Measurement of the X-ray mass attenuation coefficient and the imaginary part of the form factor of silicon using synchrotron radiation. Phys. Rev. A 67 (2003) 042716
4. 6 standard powder by the X-ray extended range technique using synchrotron radiation. Phys. Rev. A 69 (2004) 042101
5. Parrish, W., Wilson, A.J.C., Langford, J.I., in: Wilson, A.J.C., Prince, E. (Eds.), International Table for X-ray Crystallography, vol. C, Kluwer Academic, 1999, Section 5.2.10.
6. Rasberry, S.D., Hubbard, C.R., Zhang, Y., McKenzie, R.L., noted therein, 1989. National Institute of Standards and Technology SRM Certificates, Standard Reference Materials 660.
7. Rietveld H.M. A profile refinement method for nuclear and magnetic structures. J. Appl. Cryst. 2 (1969) 65