Measurement of the x-ray mass attenuation coefficient and determination of the imaginary component of the atomic form factor of tin over the energy range of 29-60 keV

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 75, Issue 3, 2007, Pages

  De Jonge, Martin D ^a   Tran, Chanh Q ^b   Chantler, Christopher T ^b   Barnea, Zwi ^b   Dhal, Bipin B ^b   Paterson, David ^c   Kanter, Elliot P ^a   Southworth, Stephen H ^a   Young, Linda ^a   Beno, Mark A ^a   Linton, Jennifer A ^a   Jennings, Guy ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c AUSTRALIAN SYNCHROTRON   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

COMPTON SCATTERING; PARAMETER ESTIMATION; PHOTOELECTRICITY; RAYLEIGH SCATTERING; SYSTEMATIC ERRORS; X RAYS;

MASS ATTENUATION COEFFICIENTS; PHOTOELECTRIC ABSORPTION; X RAY ABSORPTION; X-RAY EXTENDED-RANGE TECHNIQUE (XERT);

TIN;

EID: 33847793474     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.75.032702     Document Type: Article

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