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Volumn 56, Issue 11, 2009, Pages 2670-2674

Resistive-memory embedded unified RAM (R-URAM)

Author keywords

Capacitorless dynamic random access memory (1T DRAM); Disturb free; Dynamic random access memory (DRAM); Nonvolatile memory (NVM); Resistance random access memory (RRAM); Resistive memory embedded unified RAM (R URAM); Soft programming; Unified RAM (URAM)

Indexed keywords

CAPACITORLESS DYNAMIC RANDOM ACCESS MEMORY (1T-DRAM); DISTURB-FREE; DYNAMIC RANDOM ACCESS MEMORY (DRAM); NONVOLATILE MEMORY (NVM); RESISTANCE RANDOM ACCESS MEMORY (RRAM); RESISTIVE-MEMORY EMBEDDED UNIFIED RAM (R-URAM); SOFT PROGRAMMING; UNIFIED RAM (URAM);

EID: 70350741211     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2009.2030441     Document Type: Article
Times cited : (5)

References (16)
  • 6
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    • Mar
    • S.-W. Ryu, J.-W. Han, C.-J. Kim, S. Kim, and Y.-K. Choi, "Unified random access memory (URAM) by integration of a nanocrystal floating gate for nonvolatile memory and a partially depleted floating body for capacitorless 1T-DRAM," Solid State Electron., vol. 53, no. 3, pp. 389-391, Mar. 2009.
    • (2009) Solid State Electron , vol.53 , Issue.3 , pp. 389-391
    • Ryu, S.-W.1    Han, J.-W.2    Kim, C.-J.3    Kim, S.4    Choi, Y.-K.5
  • 13
    • 59649117424 scopus 로고    scopus 로고
    • Gate-induced drain-leakage (GIDL) programming method for soft-programming free operation in unified-RAM (URAM)
    • Feb
    • J.-W. Han, S.-W. Ryu, S.-J. Choi, and Y.-K. Choi, "Gate-induced drain-leakage (GIDL) programming method for soft-programming free operation in unified-RAM (URAM)," IEEE Electron Device Lett., vol. 30, no. 2, pp. 189-191, Feb. 2009.
    • (2009) IEEE Electron Device Lett , vol.30 , Issue.2 , pp. 189-191
    • Han, J.-W.1    Ryu, S.-W.2    Choi, S.-J.3    Choi, Y.-K.4
  • 14
    • 43749088059 scopus 로고    scopus 로고
    • Sub-100- μA reset current of nickel oxide resistive memory through control of filamentary conductance by current limit of MOSFET
    • May
    • Y. Sato, K. Tsunoda, K. Kinoshita, H. Noshiro, M. Aoki, and Y. Sugiyama, "Sub-100- μA reset current of nickel oxide resistive memory through control of filamentary conductance by current limit of MOSFET," IEEE Trans. Electron Devices, vol. 55, no. 5, pp. 1185-1191, May 2008.
    • (2008) IEEE Trans. Electron Devices , vol.55 , Issue.5 , pp. 1185-1191
    • Sato, Y.1    Tsunoda, K.2    Kinoshita, K.3    Noshiro, H.4    Aoki, M.5    Sugiyama, Y.6
  • 15
    • 0345304916 scopus 로고    scopus 로고
    • A polymer/semiconductor write-once-read-many-times memory
    • Nov
    • S. Moller, C. Perlov, W. Jackson, C. Taussig, and S. R. Forrest, "A polymer/semiconductor write-once-read-many-times memory," Nature, vol. 426, no. 6963, pp. 166-169, Nov. 2003.
    • (2003) Nature , vol.426 , Issue.6963 , pp. 166-169
    • Moller, S.1    Perlov, C.2    Jackson, W.3    Taussig, C.4    Forrest, S.R.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.