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45749123479
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A unified-RAM (URAM) cell for multi-functioning capacitorless DRAM and NVM
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J.-W. Han, S.-W. Ryu, C. Kim, S. Kim, M. Im, S. J. Choi, J. S. Kim, K. H. Kim, G. S. Lee, J. S. Oh, M. H. Song, Y. C. Park, J. W. Kim, and Y.-K. Choi, "A unified-RAM (URAM) cell for multi-functioning capacitorless DRAM and NVM," in IEDM Tech. Dig., 2007, pp. 929-932.
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Han, J.-W.1
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Kim, K.H.8
Lee, G.S.9
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Song, M.H.11
Park, Y.C.12
Kim, J.W.13
Choi, Y.-K.14
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2
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51949086339
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Band offset FinFET-based URAM (unified-RAM) built on SiC for multi-functioning NVM and capacitorless 1T-DRAM
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J.-W. Han, S.-W. Ryu, S. Kim, C.-J. Kim, J.-H. Ahn, S.-J. Choi, K. J. Choi, B. J. Cho, J. S. Kim, K. H. Kim, G. S. Lee, J. S. Oh, M. H. Song, Y. C. Park, J. W. Kim, and Y.-K. Choi, "Band offset FinFET-based URAM (unified-RAM) built on SiC for multi-functioning NVM and capacitorless 1T-DRAM," in VLSI Symp. Tech. Dig., 2008, pp. 200-201.
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Han, J.-W.1
Ryu, S.-W.2
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45749136833
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A bulk FinFET unified-RAM (URAM) cell for multi-functioning NVM and capacitorless 1T-DRAM
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Jun
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J.-W. Han, S.-W. Ryu, S. Kim, C.-J. Kim, J.-H. Ahn, S.-J. Choi, J. S. Kim, K. H. Kim, G. S. Lee, J. S. Oh, M. H. Song, Y. C. Park, J. W. Kim, and Y.-K. Choi, "A bulk FinFET unified-RAM (URAM) cell for multi-functioning NVM and capacitorless 1T-DRAM," IEEE Electron Device Lett., vol. 29, no. 6, pp. 632-634, Jun. 2008.
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4
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47249136108
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Partially-depleted SONOS FinFET for unified-RAM (URAM) - Unified function for high speed 1T-DRAM and non-volatile memory
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Jul
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J.-W. Han, S.-W. Ryu, C.-J. Kim, S. Kim, M. Im, S.-J. Choi, J. S. Kim, K. H. Kim, G. S. Lee, J. S. Oh, M. H. Song, Y. C. Park, J. W. Kim, and Y.-K. Choi, "Partially-depleted SONOS FinFET for unified-RAM (URAM) - Unified function for high speed 1T-DRAM and non-volatile memory," IEEE Electron Device Lett., vol. 29, no. 7, pp. 781-783, Jul. 2008.
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5
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64549145387
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Energy band engineered unified-RAM (URAM) for multi-functioning 1T-DRAM and NVM
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J.-W. Han, S.-W. Ryu, S. Kim, C.-J. Kim, J.-H. Ahn, S.-J. Choi, K. J. Choi, B. J. Cho, J. S. Kim, K. H. Kim, G. S. Lee, J. S. Oh, M. H. Song, Y. C. Park, J. W. Kim, and Y.-K. Choi, "Energy band engineered unified-RAM (URAM) for multi-functioning 1T-DRAM and NVM," in IEDM Tech. Dig., 2008, pp. 227-230.
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Unified random access memory (URAM) by integration of a nanocrystal floating gate for nonvolatile memory and a partially depleted floating body for capacitorless 1T-DRAM
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S.-W. Ryu, J.-W. Han, C.-J. Kim, S. Kim, and Y.-K. Choi, "Unified random access memory (URAM) by integration of a nanocrystal floating gate for nonvolatile memory and a partially depleted floating body for capacitorless 1T-DRAM," Solid State Electron., vol. 53, no. 3, pp. 389-391, Mar. 2009.
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Highly scalable non-volatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses
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I. G. Baek, M. S. Lee, S. Seo, M. J. Lee, D. H. Seo, D. S. Suh, J. C. Park, S. O. Park, H. S. Kim, I. K. Yoo, U. I. Chung, and J. T. Moon, "Highly scalable non-volatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses," in IEDM Tech. Dig., 2004, pp. 587-590.
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19944434155
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S. Seo, M. J. Lee, D. H. Seo, E. J. Jeoung, D.-S. Suh, Y. S. Joung, I. K. Yoo, I. R. Hwang, S. H. Kim, I. S. Byun, J.-S. Kim, J. S. Choi, and B. H. Park, "Reproducible resistance switching in polycrystalline NiO films," Appl. Phys. Lett., vol. 85, no. 23, pp. 5655-5657, Dec. 2004.
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54949089222
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Write current reduction in transition metal oxide based resistance-charge memory
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S.-E. Ahn, M.-J. Lee, Y. Park, B. S. Kang, C. B. Lee, K. H. Kim, S. Seo, D.-S. Suh, D.-C. Kim, J. Hur, W. Xianyu, G. Stefanovich, H. Yin, I.-K. Yoo, J.-H. Lee, J.-B. Park, I.-G. Baek, and B. H. Park, "Write current reduction in transition metal oxide based resistance-charge memory," Adv. Mater., vol. 20, no. 5, pp. 924-928, 2008.
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50249152925
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2-stack 1D-1R cross-point structure with oxide diodes as switch elements for high density resistance RAM applications
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M.-J. Lee, Y. Park, B.-S. Kang, S.-E. Ahn, C. Lee, K. Kim, W. Xianyu, G. Stefanovich, J.-H. Lee, S.-J. Chung, Y.-H. Kim, C.-S. Lee, J.-B. Park, I.-G. Baek, and I.-K. Yoo, "2-stack 1D-1R cross-point structure with oxide diodes as switch elements for high density resistance RAM applications," in IEDM Tech. Dig., 2007, pp. 771-774.
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Gate-induced drain-leakage (GIDL) programming method for soft-programming free operation in unified-RAM (URAM)
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J.-W. Han, S.-W. Ryu, S.-J. Choi, and Y.-K. Choi, "Gate-induced drain-leakage (GIDL) programming method for soft-programming free operation in unified-RAM (URAM)," IEEE Electron Device Lett., vol. 30, no. 2, pp. 189-191, Feb. 2009.
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