Electrochemical atomic-force microscopy using a tip-attached redox mediator. Proof-of-concept and perspectives for functional probing of nanosystems

ACS Nano

Volumn 3, Issue 4, 2009, Pages 819-827

  Anne, Agnes ^a   Demaille, Christophe ^a   Goyer, Cedric ^a  

^a CNRS   (France)

Author keywords

Electrochemical atomic force microscopy afm secm; Electrochemical microscopy; Redox functionalized afm tips; Secm; Tarm afm secm; Tip attached redox mediator electrochemical atomic force microscopy

Indexed keywords

ELECTROCHEMICAL ATOMIC-FORCE MICROSCOPY AFM/SECM; ELECTROCHEMICAL MICROSCOPY; REDOX-FUNCTIONALIZED AFM TIPS; SECM; TARM/AFM-SECM; TIP-ATTACHED REDOX MEDIATOR/ELECTROCHEMICAL ATOMIC-FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY; ATOMS; IRON COMPOUNDS; POLYETHYLENE GLYCOLS; PROBES; SUBSTRATES;

NANOSYSTEMS;

EID: 67049162094     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn8007788     Document Type: Article

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