Measurement of pull-off force for planar contact at the microscale

Micro and Nano Letters

Volumn 4, Issue 3, 2009, Pages 148-154

  Rabenorosoa, K ^a   Clevy C ^a   Lutz, P ^a   Gauthier, M ^a   Rougeot, P ^a  

^a FEMTO ST INSTITUTE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT FORCES; MICRO ASSEMBLY; MICRO-ASSEMBLY PROCESS; MICRO-FORCE SENSORS; MICRO-OBJECTS; MICRO-SCALES; MICROGRIPPER; NANO SCALE; PLANE GEOMETRY; PRE-LOAD FORCES; PULL-OFF FORCES; ROBOTIC SYSTEMS; SURFACE FORCES;

CONTACT ANGLE; DEGREES OF FREEDOM (MECHANICS); MICROMACHINING; MICROMANIPULATORS;

FORCE MEASUREMENT;

NANOPARTICLE;

ARTICLE; CONTACT ANGLE; CONTROLLED STUDY; ELECTRIC CAPACITANCE; ELECTRONICS; EVALUATION; FORCE; MEASUREMENT; NANOANALYSIS; NANODEVICE; NANOSENSOR; OSCILLATION; PULL OFF FORCE; ROBOTICS; SURFACE PROPERTY;

EID: 70350451465     PISSN: None     EISSN: 17500443     Source Type: Journal    
DOI: 10.1049/mnl.2009.0034     Document Type: Article

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