Effect of contact geometry on the pull-off force evaluated under high-vacuum and humid atmospheric conditions

Langmuir

Volumn 24, Issue 4, 2008, Pages 1418-1424

  Ando, Yasuhisa ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; FORCE MEASUREMENT; SILICON; VACUUM APPLICATIONS;

CONTACT GEOMETRY; FLAT CONTACT;

CONTACTS (FLUID MECHANICS);

EID: 40449115814     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la702513r     Document Type: Article

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