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Volumn 12, Issue 12, 2009, Pages

Experimental investigation of silicon surface migration in low pressure nonreducing gas environments

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT GAS; EXPERIMENTAL INVESTIGATIONS; GAS AMBIENTS; GAS ENVIRONMENT; LOW PRESSURES; MICROFABRICATED; MIGRATION RATES; NOBLE GAS; PRESSURE DEPENDENCE; SILICON SURFACES;

EID: 70350077818     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3236781     Document Type: Article
Times cited : (15)

References (18)
  • 6
    • 21544450961 scopus 로고
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    • W. W. Mullins, J. Appl. Phys. 0021-8979, 28, 333 (1957). 10.1063/1.1722742
    • (1957) J. Appl. Phys. , vol.28 , pp. 333
    • Mullins, W.W.1
  • 12
    • 0032063830 scopus 로고    scopus 로고
    • 0040-6090,. 10.1016/S0040-6090(98)00464-7
    • E. Kasper, M. Bauer, and M. Oehme, Thin Solid Films 0040-6090, 321, 148 (1998). 10.1016/S0040-6090(98)00464-7
    • (1998) Thin Solid Films , vol.321 , pp. 148
    • Kasper, E.1    Bauer, M.2    Oehme, M.3
  • 13
    • 0001864058 scopus 로고
    • 0039-6028,. 10.1016/0039-6028(81)90473-8
    • A. G. Schrott and S. C. Fain, Jr., Surf. Sci. 0039-6028, 111, 39 (1981). 10.1016/0039-6028(81)90473-8
    • (1981) Surf. Sci. , vol.111 , pp. 39
    • Schrott, A.G.1    Fain Jr., S.C.2
  • 14
    • 39049144812 scopus 로고
    • 0013-4651,. 10.1149/1.2410895
    • R. G. Frieser, J. Electrochem. Soc. 0013-4651, 115, 1092 (1968). 10.1149/1.2410895
    • (1968) J. Electrochem. Soc. , vol.115 , pp. 1092
    • Frieser, R.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.