Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization

Ultramicroscopy

Volumn 109, Issue 12, 2009, Pages 1472-1478

  Rulis, P ^a   Lupini, A R ^b   Pennycook, S J ^b   Ching, W Y ^a  

^a UNIVERSITY OF MISSOURI KANSAS CITY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Ab initio; EELS; ELNES; Si defect; Spectral imaging

Indexed keywords

AB INITIO; EELS; ELNES; SI DEFECT; SPECTRAL IMAGING;

DATA VISUALIZATION; DEFECTS; DISSOCIATION; ELECTRON ENERGY LEVELS; ENERGY DISSIPATION; NUCLEAR INSTRUMENTATION; SILICON; VISUALIZATION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

BORON;

AB INITIO CALCULATION; ACCURACY; ARTICLE; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGING; MATHEMATICAL ANALYSIS; MOLECULAR MODEL; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 70349962922     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.08.004     Document Type: Article

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