An energy-based model to predict wear in nanocrystalline diamond atomic force microscopy tips

Journal of Applied Physics

Volumn 106, Issue 6, 2009, Pages

  Agrawal, R ^a   Moldovan, N ^a,b   Espinosa, H D ^a  

^a Northwestern University   (United States)

^b ADVANCED DIAMOND TECHNOLOGIES INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM PROBE; APPLIED FORCES; ATOMIC FORCE MICROSCOPY TIPS; CONTINUED USE; DISSIPATION ENERGY; ENERGY MODEL; ENERGY-BASED MODELS; INORGANIC MOLECULES; LINEAR RELATIONSHIPS; MATERIAL PROPERTY; NANO SCALE; NANOCRYSTALLINE DIAMONDS; NITROGEN-DOPED DIAMOND; PROBE SURFACE; SCANNING PROBES; SQUARE ROOTS; TIP GEOMETRY; TIP RADIUS; WEAR RESISTANT; WEAR VOLUME;

ATOMIC FORCE MICROSCOPY; DIAMONDS; SILICON NITRIDE;

PROBES;

EID: 70349843297     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3223316     Document Type: Article

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