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Volumn 256, Issue 1, 2009, Pages 149-155

Elaboration and characterization of crystalline RF-deposited V 2 O 5 positive electrode for thin film batteries

Author keywords

Ellipsometry; Growth; Thin film batteries; Vanadium pentoxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC BATTERIES; ELECTRIC DISCHARGES; ELLIPSOMETRY; FILM GROWTH; FILM THICKNESS; GRAIN GROWTH; GROWTH (MATERIALS); SCANNING ELECTRON MICROSCOPY; SOLID ELECTROLYTES; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS; VANADIUM PENTOXIDE; X RAY DIFFRACTION;

EID: 70349786502     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.07.115     Document Type: Article
Times cited : (13)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.