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Volumn 256, Issue 1, 2009, Pages 149-155
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Elaboration and characterization of crystalline RF-deposited V 2 O 5 positive electrode for thin film batteries
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Author keywords
Ellipsometry; Growth; Thin film batteries; Vanadium pentoxide
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRIC BATTERIES;
ELECTRIC DISCHARGES;
ELLIPSOMETRY;
FILM GROWTH;
FILM THICKNESS;
GRAIN GROWTH;
GROWTH (MATERIALS);
SCANNING ELECTRON MICROSCOPY;
SOLID ELECTROLYTES;
SPECTROSCOPIC ELLIPSOMETRY;
SURFACE ROUGHNESS;
VANADIUM PENTOXIDE;
X RAY DIFFRACTION;
DISCHARGE CAPACITIES;
ELECTROCHEMICAL TEST;
MICROSTRUCTURAL CHANGES;
MORPHOLOGICAL EVOLUTION;
NON-LINEAR RELATIONSHIPS;
POSITIVE ELECTRODES;
THIN FILM BATTERY;
VANADIUM PENTOXIDE THIN FILMS;
THIN FILMS;
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EID: 70349786502
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2009.07.115 Document Type: Article |
Times cited : (13)
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References (27)
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