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Materials Research Society Symposium - Proceedings

Volumn 621, Issue , 2000, Pages

Evaluation of magnesium oxide films by spectroscopic ellipsometry

(1) Kimura, H a

a NEC CORPORATION (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; MAGNESIA; METALLIC FILMS; PLASMA DISPLAY DEVICES; REFRACTIVE INDEX; SURFACE ROUGHNESS;

MAGNESIUM OXIDE FILMS;

THIN FILMS;

EID: 0034428518 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-621-q5.7.1 Document Type: Conference Paper

Times cited : (8)

References (12)

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8
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11
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.