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Journal of the Electrochemical Society

Volumn 149, Issue 5, 2002, Pages

RF-sputtered vanadium oxide films effect of film thickness on structural and electrochemical properties

(5) Park, Yong Joon a Ryu, Kwang Sun a Park, Nam Gyu a Hong, Young Sik a Chang, Soon Ho a

a Electronics and Telecommunications Research Institute (ETRI) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; THIN FILMS; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

IMPEDANCE SPECTROSCOPY;

ELECTROCHEMISTRY;

EID: 0036574803 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.1466860 Document Type: Article

Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.