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Volumn 384, Issue 1, 2001, Pages 58-64

Spectroscopic ellipsometry investigation of V2O5 nanocrystalline thin films

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; NANOSTRUCTURED MATERIALS; SPECTROSCOPIC ANALYSIS; THIN FILMS; VANADIUM COMPOUNDS;

EID: 0035281745     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01820-4     Document Type: Article
Times cited : (47)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.