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Volumn 384, Issue 1, 2001, Pages 58-64
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Spectroscopic ellipsometry investigation of V2O5 nanocrystalline thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ELLIPSOMETRY;
NANOSTRUCTURED MATERIALS;
SPECTROSCOPIC ANALYSIS;
THIN FILMS;
VANADIUM COMPOUNDS;
SPECTROSCOPIC ELLIPSOMETRY (SE);
OPTICAL FILMS;
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EID: 0035281745
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)01820-4 Document Type: Article |
Times cited : (47)
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References (17)
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