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Volumn , Issue , 2009, Pages 125-133

Material characterization of corner and edgebond epoxy adhesives for the improvement of board-level solder joint reliability

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE STRENGTH; BOARD-LEVEL; BOARD-LEVEL RELIABILITY; CBGA PACKAGE; EPOXY ADHESIVES; FRACTURE STRENGTHS; INNOVATIVE MATERIALS; MATERIAL CHARACTERISTICS; MATERIAL CHARACTERIZATIONS; MECHANICAL RELIABILITY; MECHANICAL SHOCK; SELECTION METHODS; SHEAR TESTING; SOLDER JOINT RELIABILITY; SURFACE MATERIALS; TEST DEVICE;

EID: 70349658305     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2009.5074006     Document Type: Conference Paper
Times cited : (12)

References (11)
  • 7
    • 0034835522 scopus 로고    scopus 로고
    • Characterization of molded underfill material for flip chip ball grid array packages
    • Orlando, FL, June
    • F. Liu, Y. P. Wang, K. Chai and T. D. Her, "Characterization of molded underfill material for flip chip ball grid array packages", Proc. 51st Electronic Components & Technology Conference, Orlando, FL, June (2001), pp.288-292.
    • (2001) Proc. 51st Electronic Components & Technology Conference , pp. 288-292
    • Liu, F.1    Wang, Y.P.2    Chai, K.3    Her, T.D.4
  • 8
    • 0038160330 scopus 로고    scopus 로고
    • Optimization of black oxide coating thickness as adhesion promoter for copper substrate in plastic ic packages
    • Lebbai, M., Kim, J.K., Szeto, W.K., Yuen, M.M.F. and Tong, P., "Optimization of black oxide coating thickness as adhesion promoter for copper substrate in Plastic IC packages" " J. Electron. Mater., 32 (2003), pp.558-563.
    • (2003) J. Electron. Mater. , vol.32 , pp. 558-563
    • Lebbai, M.1    Kim, J.K.2    Szeto, W.K.3    Yuen, M.M.F.4    Tong, P.5
  • 10
    • 0038494880 scopus 로고    scopus 로고
    • JEDEC Standard JESD22-B110, November
    • JEDEC Standard JESD22-B110, "Subassembly Mechanical Shock," November 2004.
    • (2004) Subassembly Mechanical Shock


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.