-
1
-
-
51349125852
-
Drop test reliability of lead-free chip scale packages
-
Orlando, FL, 27-30 May
-
A. Farris, J.B. Pan, A. Liddicoat, B.J. Toleno, D. Maslyk, D.K. Shangguan, J. Bath, D. Willie, D.A. Geiger, "Drop test reliability of lead-free chip scale packages", Proc. 58th Electronic Components & Technology Conference (ECTC), Orlando, FL, 27-30 May, 2008, pp. 1173-1180.
-
(2008)
Proc. 58th Electronic Components & Technology Conference (ECTC)
, pp. 1173-1180
-
-
Farris, A.1
Pan, J.B.2
Liddicoat, A.3
Toleno, B.J.4
Maslyk, D.5
Shangguan, D.K.6
Bath, J.7
Willie, D.8
Geiger, D.A.9
-
2
-
-
32144435744
-
Lead-free chip scale packages: Assembly and drop test reliability
-
Jan.
-
Y. Liu, G. Tian, R.W. Johnson, and L. Crane, "Lead-free chip scale packages: assembly and drop test reliability", IEEE Transactions on Electronics Packaging Manufacturing, Vol.29, No.1, Jan. 2006, pp. 1-9.
-
(2006)
IEEE Transactions on Electronics Packaging Manufacturing
, vol.29
, Issue.1
, pp. 1-9
-
-
Liu, Y.1
Tian, G.2
Johnson, R.W.3
Crane, L.4
-
3
-
-
27844599232
-
Corner bonding of CSPs: processing and reliability
-
July
-
G. Tian, Y. Liu, R.W. Johnson, P. Lall, M. Palmer, M.N. Islam, and L. Crane, "Corner bonding of CSPs: processing and reliability", IEEE Trans. on Electronics Packaging Manufacturing, Vol.28, No.3, July 2005, pp. 231-240.
-
(2005)
IEEE Trans. on Electronics Packaging Manufacturing
, vol.28
, Issue.3
, pp. 231-240
-
-
Tian, G.1
Liu, Y.2
Johnson, R.W.3
Lall, P.4
Palmer, M.5
Islam, M.N.6
Crane, L.7
-
5
-
-
54849142200
-
Effects of glue on the bend performance of flip chip packages
-
Sep.
-
K. Meyyappan, A. McAllister, M. Kochanowski, and I. Hsu, "Effects of Glue on the Bend Performance of Flip Chip Packages", IEEE Transactions on Components and Packaging Technologies, Vol.31, No.3, Sep. 2008, pp. 670-677.
-
(2008)
IEEE Transactions on Components and Packaging Technologies
, vol.31
, Issue.3
, pp. 670-677
-
-
Meyyappan, K.1
McAllister, A.2
Kochanowski, M.3
Hsu, I.4
-
6
-
-
51349091601
-
Die-attach materials for high-density memory stacked die packaging
-
Orlando, FL, 27-30 May
-
M. Huang, J. Gandhi, S.J. Luo, T. Jiang, "Die-Attach Materials for High-Density Memory Stacked Die Packaging", Proc. 58th Electronic Components & Technology Conference (ECTC), Orlando, FL, 27-30 May, 2008, pp. 1569-1575.
-
(2008)
Proc. 58th Electronic Components & Technology Conference (ECTC)
, pp. 1569-1575
-
-
Huang, M.1
Gandhi, J.2
Luo, S.J.3
Jiang, T.4
-
7
-
-
0034835522
-
Characterization of molded underfill material for flip chip ball grid array packages
-
Orlando, FL, June
-
F. Liu, Y. P. Wang, K. Chai and T. D. Her, "Characterization of molded underfill material for flip chip ball grid array packages", Proc. 51st Electronic Components & Technology Conference, Orlando, FL, June (2001), pp.288-292.
-
(2001)
Proc. 51st Electronic Components & Technology Conference
, pp. 288-292
-
-
Liu, F.1
Wang, Y.P.2
Chai, K.3
Her, T.D.4
-
8
-
-
0038160330
-
Optimization of black oxide coating thickness as adhesion promoter for copper substrate in plastic ic packages
-
Lebbai, M., Kim, J.K., Szeto, W.K., Yuen, M.M.F. and Tong, P., "Optimization of black oxide coating thickness as adhesion promoter for copper substrate in Plastic IC packages" " J. Electron. Mater., 32 (2003), pp.558-563.
-
(2003)
J. Electron. Mater.
, vol.32
, pp. 558-563
-
-
Lebbai, M.1
Kim, J.K.2
Szeto, W.K.3
Yuen, M.M.F.4
Tong, P.5
-
9
-
-
2342618696
-
Effects of underfill adhesion on flip-chip package reliability
-
M. L. Sham, J. K. Kim, R. S.W. Lee, J.Wu, and M. M. F. Yuen, "Effects of underfill adhesion on flip-chip package reliability," Proc. Int. IEEE Conf. Asian Green Electronics (AGEC), 2004, pp. 96-101.
-
(2004)
Proc. Int. IEEE Conf. Asian Green Electronics (AGEC)
, pp. 96-101
-
-
Sham, M.L.1
Kim, J.K.2
Lee, R.S.W.3
Wu, J.4
Yuen, M.M.F.5
-
10
-
-
0038494880
-
-
JEDEC Standard JESD22-B110, November
-
JEDEC Standard JESD22-B110, "Subassembly Mechanical Shock," November 2004.
-
(2004)
Subassembly Mechanical Shock
-
-
-
11
-
-
51349138944
-
A comprehensive parallel study on the board level reliability of SAC, SACX and SCN solders
-
Orlando, FL, 27-30 May
-
F. Song, J. C. C. Lo, J. K. S. Lam, T. Jiang, S. W. R. Lee, "A comprehensive parallel study on the board level reliability of SAC, SACX and SCN solders," Proc. 58th Electronic Components & Technology Conference (ECTC), Orlando, FL, 27-30 May, 2008, pp. 146-154.
-
(2008)
Proc. 58th Electronic Components & Technology Conference (ECTC)
, pp. 146-154
-
-
Song, F.1
Lo, J.C.C.2
Lam, J.K.S.3
Jiang, T.4
Lee, S.W.R.5
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