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Volumn , Issue , 2004, Pages 96-101

Effects of underfill adhesion on flip chip package reliability

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; FLIP CHIP DEVICES; INTERFACES (MATERIALS); MASKS; PASSIVATION; SILICON NITRIDE; THERMAL CYCLING;

EID: 2342618696     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (19)
  • 1
    • 0032089697 scopus 로고    scopus 로고
    • Measurements of solder bump lifetime as a function of underfill material properties
    • June
    • Nysaether, J.B., Lundstrom, P. & Liu, J., "Measurements of solder bump lifetime as a function of underfill material properties", IEEE Trans on CPMT-Part A, vol. 21, No. 2, June (1998), pp.281-287.
    • (1998) IEEE Trans on CPMT-part A , vol.21 , Issue.2 , pp. 281-287
    • Nysaether, J.B.1    Lundstrom, P.2    Liu, J.3
  • 3
    • 0036217120 scopus 로고    scopus 로고
    • Adhesion of underfill and components in flip chip encapsulation
    • Fan, L., Moon, K.S. and Wong, C.P., "Adhesion of underfill and components in flip chip encapsulation", J. Adhesion Sci. Technol., 16 (2002), 213-223.
    • (2002) J. Adhesion Sci. Technol. , vol.16 , pp. 213-223
    • Fan, L.1    Moon, K.S.2    Wong, C.P.3
  • 4
    • 0031277030 scopus 로고    scopus 로고
    • Encapsulant materials system for flip-chip-on-board assemblies: Addressing manufacturing issues
    • Gamota, D.R. & Melton, C.M., "Encapsulant materials system for flip-chip-on-board assemblies: addressing manufacturing issues", Circuit World, 24/1 (1997), pp.7-12.
    • (1997) Circuit World , vol.24 , Issue.1 , pp. 7-12
    • Gamota, D.R.1    Melton, C.M.2
  • 5
    • 0031165723 scopus 로고    scopus 로고
    • Evaluation of epoxy underfill materials for solder flip-chip technology
    • Park, C.E., Han, B.J., Bair, H.E., and Raju, V.R., "Evaluation of Epoxy Underfill Materials For Solder Flip-Chip Technology", J. Mater. Sci. Lett., 16 (1997), pp. 1027-1029.
    • (1997) J. Mater. Sci. Lett. , vol.16 , pp. 1027-1029
    • Park, C.E.1    Han, B.J.2    Bair, H.E.3    Raju, V.R.4
  • 7
    • 0033344406 scopus 로고    scopus 로고
    • Characterization of underfill/substrate interfacial toughness enhancement by silane additives
    • Oct.
    • Yao, Q., Qu, J., Wu, J. & Wong, C.P., "Characterization of underfill/substrate interfacial toughness enhancement by silane additives", IEEE Transactions on Electronics Packaging Manufacturing, vol. 22, No. 4, Oct. (1999), pp.264-267.
    • (1999) IEEE Transactions on Electronics Packaging Manufacturing , vol.22 , Issue.4 , pp. 264-267
    • Yao, Q.1    Qu, J.2    Wu, J.3    Wong, C.P.4
  • 11
    • 0033909674 scopus 로고    scopus 로고
    • A failure criterion for bonding between encapsulants and leadframes in plastic IC packages
    • Yi, S., Shen, L., Kim, J.K. & Vue, C.Y., "A failure criterion for bonding between encapsulants and leadframes in plastic IC packages", J. Adhes. Sci. Technol., 14 (2000), pp.93-105.
    • (2000) J. Adhes. Sci. Technol. , vol.14 , pp. 93-105
    • Yi, S.1    Shen, L.2    Kim, J.K.3    Vue, C.Y.4
  • 12
    • 0034501272 scopus 로고    scopus 로고
    • Adhesion strength of epoxy moulding compounds to gold-plated copper leadframes
    • Yi, S., Kim, J.K., Yue, C.Y. & Hsieh, J.H., "Adhesion strength of epoxy moulding compounds to gold-plated copper leadframes", J. Adhesion, 73 (2000), pp.1-17.
    • (2000) J. Adhesion , vol.73 , pp. 1-17
    • Yi, S.1    Kim, J.K.2    Yue, C.Y.3    Hsieh, J.H.4
  • 13
    • 0035278926 scopus 로고    scopus 로고
    • Effect of UV/ozone treatment on surface tension and adhesion in electronic packaging
    • Luo, S. and Wong, C.P., "Effect of UV/ozone treatment on surface tension and adhesion in electronic packaging", IEEE Trans. Comp. Packag. Technol., 24 (2001), pp.43-49.
    • (2001) IEEE Trans. Comp. Packag. Technol. , vol.24 , pp. 43-49
    • Luo, S.1    Wong, C.P.2
  • 14
    • 0038160330 scopus 로고    scopus 로고
    • Optimization of black oxide coating thickness as adhesion promoter for copper substrate in Plastic IC packages
    • Lebbai, M., Kim, J.K., Szeto, W.K., Yuen, M.M.F. and Tong, P., "Optimization of black oxide coating thickness as adhesion promoter for copper substrate in Plastic IC packages" J. Electron. Mater., 32 (2003), pp.558-563
    • (2003) J. Electron. Mater. , vol.32 , pp. 558-563
    • Lebbai, M.1    Kim, J.K.2    Szeto, W.K.3    Yuen, M.M.F.4    Tong, P.5
  • 16
    • 0032108613 scopus 로고    scopus 로고
    • The effects of flux materials on the moisture sensitivity and reliability of flip-chip-on-board assemblies
    • Beddingfield, C. and Higgins III, L.M., "The effects of flux materials on the moisture sensitivity and reliability of flip-chip-on-board assemblies", IEEE. Trans. Comp. Packag. Manuf. Technol., Part C, 21 (1998), 189-195.
    • (1998) IEEE. Trans. Comp. Packag. Manuf. Technol., Part C , vol.21 , pp. 189-195
    • Beddingfield, C.1    Higgins III, L.M.2
  • 17
    • 0038819080 scopus 로고    scopus 로고
    • An investigation into the effects of flux residues on properties of underfill materials for flip chip packages
    • Zhang, F., Li, M., Chen, W.T. and Chian, K.S., "An investigation into the effects of flux residues on properties of underfill materials for flip chip packages", IEEE Trans. Comp. Packag. Manuf. Technol., 26 (2003), pp. 233-238.
    • (2003) IEEE Trans. Comp. Packag. Manuf. Technol. , vol.26 , pp. 233-238
    • Zhang, F.1    Li, M.2    Chen, W.T.3    Chian, K.S.4
  • 18
    • 0036881788 scopus 로고    scopus 로고
    • Study on underfill/solder adhesion in flip-chip encapsulation
    • Fan, L., Tison, C.K., Wong, C.P, "Study on underfill/solder adhesion in flip-chip encapsulation", IEEE Trans. Adv. Packag., 25 (2002), pp.473-480.
    • (2002) IEEE Trans. Adv. Packag. , vol.25 , pp. 473-480
    • Fan, L.1    Tison, C.K.2    Wong, C.P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.