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Journal of Applied Physics

Volumn 106, Issue 6, 2009, Pages

Symmetry of residual stress fields of ZnO below an indent measured by three-dimensional Raman spectroscopy

(2) Wermelinger, Thomas a Spolenak, Ralph a

a ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BIAXIAL STRESS; CONFOCAL RAMAN MICROSCOPES; CROSS SECTION; DEFORMATION MECHANISM; DEFORMED MICROSTRUCTURE; DISLOCATION DENSITIES; MICROSTRUCTURAL CHANGES; OPTICAL AND ELECTRICAL PROPERTIES; PRISM PLANES; RAMAN MEASUREMENTS; RESIDUAL STRESS FIELDS; THREE-DIMENSIONAL (3D); ULTRAVIOLET NANOLASERS; VICKERS; WIDE-GAP SEMICONDUCTOR; ZNO; ZNO SINGLE CRYSTALS;

CATHODOLUMINESCENCE; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRIC PROPERTIES; NANOPHOTONICS; OPTICAL PROPERTIES; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; SEMICONDUCTING ZINC COMPOUNDS; SINGLE CRYSTALS; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

CRYSTAL SYMMETRY;

EID: 70349638089 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3224891 Document Type: Article

Times cited : (11)

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