-
1
-
-
1542713832
-
-
0003-6951 10.1063/1.122077.
-
D. M. Bagnall, Y. F. Chen, Z. Zhu, T. Yao, M. Y. Shen, and T. Goto, Appl. Phys. Lett. 0003-6951 10.1063/1.122077 73, 1038 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 1038
-
-
Bagnall, D.M.1
Chen, Y.F.2
Zhu, Z.3
Yao, T.4
Shen, M.Y.5
Goto, T.6
-
2
-
-
7044225002
-
-
e.g., 0021-8979 10.1063/1.1785852.
-
e.g., A. Setiawan, Z. Vashaei, M. W. Cho, T. Yao, H. Kato, M. Sano, K. Miyamoto, I. Yonenaga, and H. J. Ko, J. Appl. Phys. 0021-8979 10.1063/1.1785852 96, 3763 (2004).
-
(2004)
J. Appl. Phys.
, vol.96
, pp. 3763
-
-
Setiawan, A.1
Vashaei, Z.2
Cho, M.W.3
Yao, T.4
Kato, H.5
Sano, M.6
Miyamoto, K.7
Yonenaga, I.8
Ko, H.J.9
-
3
-
-
43949143554
-
-
0021-8979 10.1063/1.2908193.
-
I. Yonenaga, H. Koizumi, T. Taishi, and Y. Ohno, J. Appl. Phys. 0021-8979 10.1063/1.2908193 103, 093502 (2008).
-
(2008)
J. Appl. Phys.
, vol.103
, pp. 093502
-
-
Yonenaga, I.1
Koizumi, H.2
Taishi, T.3
Ohno, Y.4
-
4
-
-
33748121588
-
-
0003-6951 10.1063/1.2338552.
-
V. A. Coleman, J. E. Bradby, C. Jagadish, and M. R. Phillips, Appl. Phys. Lett. 0003-6951 10.1063/1.2338552 89, 082102 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.89
, pp. 082102
-
-
Coleman, V.A.1
Bradby, J.E.2
Jagadish, C.3
Phillips, M.R.4
-
5
-
-
23344448251
-
-
0921-4526
-
Z. Takkouk, N. Brihi, K. Guergouri, and Y. Marfaing, Physica B (Amsterdam) 366, 185 (2005). 0921-4526
-
(2005)
Physica B (Amsterdam)
, vol.366
, pp. 185
-
-
Takkouk, Z.1
Brihi, N.2
Guergouri, K.3
Marfaing, Y.4
-
7
-
-
0034507263
-
-
0953-8984 10.1088/0953-8984/12/49/308.
-
K. Maeda, K. Suzuki, Y. Yamashita, and Y. Mera, J. Phys.: Condens. Matter 0953-8984 10.1088/0953-8984/12/49/308 12, 10079 (2000).
-
(2000)
J. Phys.: Condens. Matter
, vol.12
, pp. 10079
-
-
Maeda, K.1
Suzuki, K.2
Yamashita, Y.3
Mera, Y.4
-
8
-
-
33845579360
-
-
0022-0248 10.1016/j.jcrysgro.2006.09.043.
-
W. -R. Liu, W. F. Hsieh, C. -H. Hsu, K. S. Liang, and F. S.-S. Chien, J. Cryst. Growth 0022-0248 10.1016/j.jcrysgro.2006.09.043 297, 294 (2006).
-
(2006)
J. Cryst. Growth
, vol.297
, pp. 294
-
-
Liu, W.-R.1
Hsieh, W.F.2
Hsu, C.-H.3
Liang, K.S.4
Chien, F.S.-S.5
-
9
-
-
33745106293
-
-
0163-1829 10.1103/PhysRevB.73.245316.
-
E. Muller, D. Gerthsen, P. Bruckner, F. Scholz, Th. Gruber, and A. Waag, Phys. Rev. B 0163-1829 10.1103/PhysRevB.73.245316 73, 245316 (2006).
-
(2006)
Phys. Rev. B
, vol.73
, pp. 245316
-
-
Muller, E.1
Gerthsen, D.2
Bruckner, P.3
Scholz, F.4
Gruber, Th.5
Waag, A.6
-
10
-
-
0038070196
-
-
0925-3467 10.1016/S0925-3467(03)00055-7.
-
H. Alves, D. Pfisterer, A. Zeuner, T. Riemann, J. Christen, D. M. Hofmann, and B. K. Meyer, Opt. Mater. (Amsterdam, Neth.) 0925-3467 10.1016/S0925-3467(03)00055-7 23, 33 (2003).
-
(2003)
Opt. Mater. (Amsterdam, Neth.)
, vol.23
, pp. 33
-
-
Alves, H.1
Pfisterer, D.2
Zeuner, A.3
Riemann, T.4
Christen, J.5
Hofmann, D.M.6
Meyer, B.K.7
-
11
-
-
36048999803
-
-
0921-4526
-
M. Schirra, R. Schneider, A. Reiser, G. M. Prinz, M. Feneberg, J. Biskupek, U. Kaiser, C. E. Krill, R. Sauer, and K. Thonke, Physica B (Amsterdam) 401-402, 362 (2007). 0921-4526
-
(2007)
Physica B (Amsterdam)
, vol.401-402
, pp. 362
-
-
Schirra, M.1
Schneider, R.2
Reiser, A.3
Prinz, G.M.4
Feneberg, M.5
Biskupek, J.6
Kaiser, U.7
Krill, C.E.8
Sauer, R.9
Thonke, K.10
-
12
-
-
0042496097
-
-
0957-4484 10.1088/0957-4484/14/7/317.
-
R. Radoi, P. Fernandez, J. Piqueras, M. S. Wiggins, and J. Solos, Nanotechnology 0957-4484 10.1088/0957-4484/14/7/317 14, 794 (2003).
-
(2003)
Nanotechnology
, vol.14
, pp. 794
-
-
Radoi, R.1
Fernandez, P.2
Piqueras, J.3
Wiggins, M.S.4
Solos, J.5
-
13
-
-
0035823677
-
-
0022-3727 10.1088/0022-3727/34/19/303.
-
A. Urbieta, P. Fernandez, J. Piqueras, Ch. Hardalov, and T. Sekiguchi, J. Phys. D 0022-3727 10.1088/0022-3727/34/19/303 34, 2945 (2001).
-
(2001)
J. Phys. D
, vol.34
, pp. 2945
-
-
Urbieta, A.1
Fernandez, P.2
Piqueras, J.3
Hardalov, Ch.4
Sekiguchi, T.5
-
14
-
-
38049074734
-
-
0003-6951 10.1063/1.2831001.
-
Y. Ohno, H. Koizumi, T. Taishi, I. Yonenaga, K. Fujii, H. Goto, and T. Yao, Appl. Phys. Lett. 0003-6951 10.1063/1.2831001 92, 011922 (2008).
-
(2008)
Appl. Phys. Lett.
, vol.92
, pp. 011922
-
-
Ohno, Y.1
Koizumi, H.2
Taishi, T.3
Yonenaga, I.4
Fujii, K.5
Goto, H.6
Yao, T.7
-
15
-
-
54049109425
-
-
Even though a dislocation is believed to be dissociated with dissociation width of less than 2 nm (Ref.), it is difficult to detect under the present experimental condition.
-
Even though a dislocation is believed to be dissociated with dissociation width of less than 2 nm (Ref.), it is difficult to detect under the present experimental condition.
-
-
-
-
16
-
-
0028381956
-
-
0021-4922 10.1143/JJAP.33.1114.
-
K. Suzuki, M. Ichihara, and S. Takeuchi, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.33.1114 33, 1114 (1994).
-
(1994)
Jpn. J. Appl. Phys., Part 1
, vol.33
, pp. 1114
-
-
Suzuki, K.1
Ichihara, M.2
Takeuchi, S.3
-
17
-
-
79956012627
-
-
0003-6951 10.1063/1.1486264.
-
J. E. Bradby, S. O. Kucheyev, J. S. Williams, C. Jagadish, M. V. Swain, P. Munroe, and M. R. Phillips, Appl. Phys. Lett. 0003-6951 10.1063/1.1486264 80, 4537 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 4537
-
-
Bradby, J.E.1
Kucheyev, S.O.2
Williams, J.S.3
Jagadish, C.4
Swain, M.V.5
Munroe, P.6
Phillips, M.R.7
-
18
-
-
0003598030
-
-
(Butterworth, London), Cha.
-
P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Butterworth, London, 1965), Chap..
-
(1965)
Electron Microscopy of Thin Crystals
-
-
Hirsch, P.B.1
Howie, A.2
Nicholson, R.B.3
Pashley, D.W.4
Whelan, M.J.5
-
19
-
-
25144462707
-
-
As a review, 0021-8979 10.1063/1.1992666.
-
As a review, U. Ozgur, Y. I. Alivov, C. Liu, A. Teke, M. A. Reshchikov, S. Doian, V. Avrutin, S. J. Cho, and H. Morkoc, J. Appl. Phys. 0021-8979 10.1063/1.1992666 98, 041301 (2005).
-
(2005)
J. Appl. Phys.
, vol.98
, pp. 041301
-
-
Ozgur, U.1
Alivov, Y.I.2
Liu, C.3
Teke, A.4
Reshchikov, M.A.5
Doian, S.6
Avrutin, V.7
Cho, S.J.8
Morkoc, H.9
-
20
-
-
0005629256
-
-
e.g., 0163-1829 10.1103/PhysRevB.32.986.
-
e.g., P. O. Holtz, B. Monemar, and H. J. Lozykowski, Phys. Rev. B 0163-1829 10.1103/PhysRevB.32.986 32, 986 (1985).
-
(1985)
Phys. Rev. B
, vol.32
, pp. 986
-
-
Holtz, P.O.1
Monemar, B.2
Lozykowski, H.J.3
-
21
-
-
3142601597
-
-
0021-8979 10.1063/1.1649451.
-
A. B. M. A. Ashrafi, N. T. Binh, B. P. Zhang, and Y. Segawa, J. Appl. Phys. 0021-8979 10.1063/1.1649451 95, 7738 (2004).
-
(2004)
J. Appl. Phys.
, vol.95
, pp. 7738
-
-
Ashrafi, A.B.M.A.1
Binh, N.T.2
Zhang, B.P.3
Segawa, Y.4
-
22
-
-
33751568943
-
-
0031-899X 10.1103/PhysRev.82.900.
-
H. Y. Fan, Phys. Rev. 0031-899X 10.1103/PhysRev.82.900 82, 900 (1951).
-
(1951)
Phys. Rev.
, vol.82
, pp. 900
-
-
Fan, H.Y.1
-
23
-
-
54049146478
-
-
The peak energies for the 3.100 eV emission band at T=200 K, as well as those for the 3.345 eV emission band at T=30-200 K, were not obtained quantitatively due to large experimental error.
-
The peak energies for the 3.100 eV emission band at T=200 K, as well as those for the 3.345 eV emission band at T=30-200 K, were not obtained quantitatively due to large experimental error.
-
-
-
-
24
-
-
0001007641
-
-
For example, 0163-1829 10.1103/PhysRevB.45.8989.
-
For example, T. Schmidt, K. Lischka, and W. Zulehner, Phys. Rev. B 0163-1829 10.1103/PhysRevB.45.8989 45, 8989 (1992).
-
(1992)
Phys. Rev. B
, vol.45
, pp. 8989
-
-
Schmidt, T.1
Lischka, K.2
Zulehner, W.3
-
25
-
-
0000440064
-
-
For example, 0022-2313 10.1016/0022-2313(86)90019-0.
-
For example, Z. C. Feng, A. Mascarenhas, and W. J. Choyke, J. Lumin. 0022-2313 10.1016/0022-2313(86)90019-0 35, 329 (1986).
-
(1986)
J. Lumin.
, vol.35
, pp. 329
-
-
Feng, Z.C.1
Mascarenhas, A.2
Choyke, W.J.3
-
27
-
-
0348229289
-
-
0022-0248 10.1016/j.jcrysgro.2003.09.040.
-
H. -C. Hsu, Y. -K. Tseng, H. -M. Cheng, J. -H. Kuo, and W. -F. Hsieh, J. Cryst. Growth 0022-0248 10.1016/j.jcrysgro.2003.09.040 261, 520 (2004).
-
(2004)
J. Cryst. Growth
, vol.261
, pp. 520
-
-
Hsu, H.-C.1
Tseng, Y.-K.2
Cheng, H.-M.3
Kuo, J.-H.4
Hsieh, W.-F.5
-
28
-
-
33745452148
-
-
1089-5647 10.1021/jp0610968.
-
S. L. Shi, G. Q. Li, S. J. Xu, Y. Zhao, and G. H. Chen, J. Phys. Chem. B 1089-5647 10.1021/jp0610968 110, 10475 (2006).
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 10475
-
-
Shi, S.L.1
Li, G.Q.2
Xu, S.J.3
Zhao, Y.4
Chen, G.H.5
-
30
-
-
0034513403
-
-
0953-8984 10.1088/0953-8984/12/49/316.
-
U. Hilpert, J. Schreiber, L. Worschech, L. Horing, M. Ramsteiner, W. Ossau, and G. Landwehr, J. Phys.: Condens. Matter 0953-8984 10.1088/0953-8984/ 12/49/316 12, 10169 (2000).
-
(2000)
J. Phys.: Condens. Matter
, vol.12
, pp. 10169
-
-
Hilpert, U.1
Schreiber, J.2
Worschech, L.3
Horing, L.4
Ramsteiner, M.5
Ossau, W.6
Landwehr, G.7
-
32
-
-
27844553530
-
-
0003-6951 10.1063/1.2135880.
-
Q. X. Zhao, P. Klason, M. Willander, H. M. Zhong, W. Lu, and J. H. Yang, Appl. Phys. Lett. 0003-6951 10.1063/1.2135880 87, 211912 (2005).
-
(2005)
Appl. Phys. Lett.
, vol.87
, pp. 211912
-
-
Zhao, Q.X.1
Klason, P.2
Willander, M.3
Zhong, H.M.4
Lu, W.5
Yang, J.H.6
-
33
-
-
33646814942
-
-
0361-5235 10.1007/s11664-006-0127-8.
-
I. Yonenaga, H. Makino, S. Itoh, T. Goto, and T. Yao, J. Electron. Mater. 0361-5235 10.1007/s11664-006-0127-8 35, 717 (2006).
-
(2006)
J. Electron. Mater.
, vol.35
, pp. 717
-
-
Yonenaga, I.1
Makino, H.2
Itoh, S.3
Goto, T.4
Yao, T.5
-
34
-
-
0001492071
-
-
e.g., 0003-6951 10.1063/1.1328047.
-
e.g., S. O. Kucheyev, J. E. Bradby, J. S. Williams, C. Jagadish, M. Toth, M. R. Phillips, and M. V. Swain, Appl. Phys. Lett. 0003-6951 10.1063/1.1328047 77, 3373 (2000).
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 3373
-
-
Kucheyev, S.O.1
Bradby, J.E.2
Williams, J.S.3
Jagadish, C.4
Toth, M.5
Phillips, M.R.6
Swain, M.V.7
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