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Volumn 48, Issue 5 PART 3, 2009, Pages

Measurement of refractive index, specific heat capacity, and thermal conductivity for ag6.0In4.5Sb60.8Te 28.7 at high temperature

(10) Kuwahara, Masashi a Suzuki, Osamu a Tsutsumi, Kouichi c Yagi, Takashi b Taketoshi, Naoyuki b Kato, Hideyuki b Simpson, Robert E a Suzuki, Michio c Tominaga, Junji a Baba, Tetsuya b

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

c J A Woollam Japan Co (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL SCANNING CALORIMETERS; HIGH TEMPERATURE; ROOM TEMPERATURE; SPECIFIC HEAT CAPACITY; SUBMICRON; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENCE OF REFRACTIVE INDEX; THERMOREFLECTANCE MEASUREMENT; WAVELENGTH RANGES;

DIFFERENTIAL SCANNING CALORIMETRY; FILM THICKNESS; LIGHT REFRACTION; REFRACTIVE INDEX; REFRACTOMETERS; SILVER; SPECIFIC HEAT; SPECTROSCOPIC ELLIPSOMETRY; TELLURIUM COMPOUNDS; TEMPERATURE DISTRIBUTION; THERMAL CONDUCTIVITY; THERMOANALYSIS;

MELTING POINT;

EID: 70249132562 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.38.05EC02 Document Type: Article

Times cited : (11)

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