Thermal conductivity measurements of Sb-Te alloy thin films using a nanosecond thermoreflectance measurement system

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 10 A, 2007, Pages 6863-6864

  Kuwahara, Masashi ^a   Suzuki, Osamu ^a   Taketoshi, Naoyuki ^b   Yagi, Takashi ^b   Fons, Paul ^a   Tominaga, Junji ^a   Baba, Tetsuya ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Optical disks; Phase change memory; Sb Te alloys; Thermal conductivity; Thermoreflectance

Indexed keywords

ANTIMONY ALLOYS; CRYSTAL STRUCTURE; OPTICAL DISK STORAGE; PHASE CHANGE MEMORY; TELLURIUM COMPOUNDS; THERMAL CONDUCTIVITY;

ATOMIC NETWORKS; ATOMIC RATIOS; NANOSECOND THERMOREFLECTANCE MEASUREMENT SYSTEMS; OPTICAL DISKS;

THIN FILMS;

EID: 35348851890     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.6863     Document Type: Article

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