Temperature dependence of structural and optical properties of GeSbTe alloy thin films

Journal of Magnetism and Magnetic Materials

Volumn 249, Issue 3, 2002, Pages 509-512

  Chabli, A ^a   Vergnaud, C ^a   Bertin, F ^a   Gehanno, V ^a   Valon, B ^a   Hyot, B ^a   Bechevet, B ^a   Burdin, M ^a   Muyard, D ^a  

^a CEA LETI   (France)

Author keywords

Ellipsometry; Optical properties; Phase change; Temperature dependence

Indexed keywords

ELLIPSOMETRY; GERMANIUM COMPOUNDS; PRECIPITATION (CHEMICAL); SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

GRAZING; PHASE CHANGE;

OPTICAL RECORDING;

EID: 0036752336     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(02)00471-7     Document Type: Conference Paper

References (6)

1. Yasuda K., Ono M., Aratani K., Fukumoto A., Kaneko M. Jpn. J. Appl. Phys. 32:1993;5210.
2. Liu J.R., Liu P.Y., Tang N.Y., Shieh H.P.D. Appl. Opt. 37(35):1998;8187.
3. G.E. Jellison Jr., F.A. Modine, Appl. Phys. Lett. 69 (1996) 371 and 2137 (Errata).
4. Jellison G.E. Jr., Modine F.A. J. Appl. Phys. 76(6):1994;3758.
5. Sik J., Hora J., Humlicek J. J. Appl. Phys. 84(11):1998;6291.
6. Ide T., Suzuki M., Okada M. Jpn. J. Appl. Phys. 34:1995;L529.