A reversible change of reflected light intensity between molten and solidified Ge-Sb-Te alloy

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 46, Issue 36-40, 2007, Pages

  Kuwahara, Masashi ^a   Endo, Rie ^b   Fukaya, Toshio ^a   Shima, Takayuki ^a   Iwanabe, Yasuhiko ^a   Fons, Paul ^a   Tominaga, Junji ^a   Susa, Masahiro ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Ge Sb Te alloy; Melting point; Optical disk; Reflected light intensity; Static measurement

Indexed keywords

GERMANIUM COMPOUNDS; HEAT TREATMENT; MELTING POINT; RAMAN SCATTERING; SOLIDIFICATION;

OPTICAL DISKS; REFLECTED LIGHT INTENSITY; STATIC MEASUREMENT; X RAY FLUORESCENCE;

GERMANIUM ALLOYS;

EID: 36048957150     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.L868     Document Type: Article

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