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Volumn 46, Issue 8 A, 2007, Pages 5278-5280

Temperature dependence of complex refractive index of sputtered Sb-Te alloy thin films

Author keywords

Optical disc; Refractive index; Sb Te alloy; Spectroscopic ellipsometry; Temperature dependence; Thermoreflectance phenomenon

Indexed keywords

REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; TEMPERATURE DISTRIBUTION; THIN FILMS;

OPTICAL DISCS; TEMPERATURE DEPENDENCE; THERMOREFLECTANCE PHENOMENON;

ANTIMONY ALLOYS;

EID: 34547912521 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.46.5278 Document Type: Article

Times cited : (14)

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