An approach for recording and readout beyond the diffraction limit with an Sb thin film

Applied Physics Letters

Volumn 73, Issue 15, 1998, Pages 2078-2080

  Tominaga, J ^a   Nakano, T ^a   Atoda, N ^a  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; DIFFRACTION; LASER BEAMS; NONLINEAR OPTICS; OPTICAL SYSTEMS; SEMICONDUCTING SILICON COMPOUNDS; SIGNAL DETECTION; SIGNAL TO NOISE RATIO; THIN FILMS;

CARRIER TO NOISE RATIO; LASER WAVELENGTH; OPTICAL DIFFRACTION LIMIT;

OPTICAL DATA STORAGE;

EID: 0032511672     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122383     Document Type: Article

References (13)

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