메뉴 건너뛰기




Volumn 30, Issue 9, 2009, Pages 957-959

3510-V 390-mΩ · cm2 4H-SiC lateral JFET on a semi-insulating substrate

Author keywords

High voltage; JFETs; Lateral; Silicon carbide

Indexed keywords

BREAKDOWN VOLTAGE; CHARGE COMPENSATION; HIGH VOLTAGE; HIGH-VOLTAGES; JFETS; LATERAL; LATERAL DEVICE; LATERAL SWITCHING DEVICE; SEMI-INSULATING SUBSTRATE;

EID: 69949156070     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2009.2027722     Document Type: Article
Times cited : (9)

References (11)
  • 4
    • 34247873095 scopus 로고    scopus 로고
    • 4H-SiC lateral double RESURF MOSFETs with low on resistance
    • May
    • M. Noborio, J. Suda, and T. Kimoto, "4H-SiC lateral double RESURF MOSFETs with low on resistance," IEEE Trans. Electron Devices, vol. 54, no. 5, pp. 1216-1223, May 2007.
    • (2007) IEEE Trans. Electron Devices , vol.54 , Issue.5 , pp. 1216-1223
    • Noborio, M.1    Suda, J.2    Kimoto, T.3
  • 7
    • 37549002068 scopus 로고    scopus 로고
    • High voltage (3130 V) 4H-SiC lateral p-n diodes on a semiinsulating substrate
    • Jan
    • C. F. Huang, J. R. Kuo, and C. C. Tsai, "High voltage (3130 V) 4H-SiC lateral p-n diodes on a semiinsulating substrate," IEEE Electron Device Lett., vol. 29, no. 1, pp. 83-85, Jan. 2008.
    • (2008) IEEE Electron Device Lett , vol.29 , Issue.1 , pp. 83-85
    • Huang, C.F.1    Kuo, J.R.2    Tsai, C.C.3
  • 8
    • 0035395786 scopus 로고    scopus 로고
    • Electron mobility models for 4H, 6H, and 3C SiC
    • Jul
    • M. Roschke and F. Schwierz, "Electron mobility models for 4H, 6H, and 3C SiC," IEEE Trans. Electron Devices, vol. 48, no. 7, pp. 1442-1447, Jul. 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , Issue.7 , pp. 1442-1447
    • Roschke, M.1    Schwierz, F.2
  • 10
    • 0042527393 scopus 로고    scopus 로고
    • Reduced trapping effects and improved electrical performance in buried-gate 4H-SiC MESFETs
    • Jul
    • H. Cha, C. I. Thomas, G. Koley, L. F. Eastman, and M. G. Spencer, "Reduced trapping effects and improved electrical performance in buried-gate 4H-SiC MESFETs," IEEE Trans. Electron Devices, vol. 50, no. 7, pp. 1569-1574, Jul. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , Issue.7 , pp. 1569-1574
    • Cha, H.1    Thomas, C.I.2    Koley, G.3    Eastman, L.F.4    Spencer, M.G.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.