Fabrication and annealing effects of SnO2/SiOx nanocables sheathed by the sputtering technique

Current Applied Physics

Volumn 10, Issue 1, 2010, Pages 47-51

  Kim, Hyoun Woo ^a   Shim, Seung Hyun ^a   Lee, Jong Woo ^a   Kim, Hyo Sung ^a   Kebede, Mesfin Abayneh ^a   Na, Han Gil ^a   Yang, Ju Chan ^a   Kong, Myung Ho ^a   Lee, Chongmu ^a  

^a Inha University   (South Korea)

Author keywords

Nanostructures; Transmission electron microscopy

Indexed keywords

ANNEALING EFFECTS; CORE-SHELL NANOWIRES; ELEMENTAL MAPPING; GAUSSIAN FITTING; NANO-SIZED; NANOCABLES; OUTER SURFACE; PL EMISSION; PL MEASUREMENTS; RELATIVE INTENSITY; ROOM TEMPERATURE; RUTILE STRUCTURE; SHELL LAYERS; SPUTTERING METHODS; SPUTTERING TECHNIQUES; THERMAL-ANNEALING; YELLOW BANDS;

ANNEALING; CRYSTALLINE MATERIALS; ELECTRIC WIRE; LIGHT TRANSMISSION; NANOWIRES; OXIDE MINERALS; SHELLS (STRUCTURES); SILICON COMPOUNDS; TIN; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON MICROSCOPES;

EID: 69249214193     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2009.04.009     Document Type: Article

References (37)

1. Duan X.F., Huang Y., Cui Y., Wang J., and Lieber C.M. Nature 409 (2001) 66
2. Huang M.H., Mao S., Feick H., Yan H.Q., Wu Y.Y., Kind H., Weber E., Russo R., and Yang P.D. Science 292 (2001) 1897
3. Zhang Y., Suenage K., Colliex C., and Iijima S. Science 281 (1998) 973
4. Wu Y., Xiang J., Yang C., Lu W., and Lieber C.M. Nature 430 (2004) 61
5. Lauhon L.J., Gudiksen M.S., Wang D., and Lieber C.M. Nature 420 (2002) 57
6. Choi H.-J., Johnson J.C., He R., Lee S.-K., Kim F., Pauzauskie P., Golberger J., Saykally R.J., and Yang P. J. Phys. Chem. B 107 (2003) 8721
7. Ansari G., Boroojerdian P., Sainkar S.R., Karekar R.N., Alyer R.C., and Kulkarni S.K. Thin Solid Films 295 (1997) 271
8. Ferrere S., Zaban A., and Gsegg B.A. J. Phys. Chem. B 101 (1997) 4490
9. He Y.S., Campbell J.C., Murphy R.C., Arendt M.F., and Swinnnea J.C. J. Mater. Res. 8 (1993) 3131
10. Dazhi W., Shulin W., Jun C., Suyuan Z., and Fangqing L. Phys. Rev. B 49 (1994) 282
11. Zhang R.-Q., Lifshitz Y., and Lee S.-T. Adv. Mater. 15 (2003) 635
12. Wang Z.L., and Pan Z. Adv. Mater. 14 (2002) 1029
13. Peng X.S., Zhang L.D., Meng G.W., Tian Y.T., Lin Y., Geng B.Y., and Sun S.H. J. Appl. Phys. 93 (2003) 1760
14. Mann S., and Ozin G.A. Nature 382 (1996) 313
15. Katz A., and Davis M.E. Nature 403 (2000) 286
16. Kresge C.T., Leonowicz M.E., Roth W.J., Vartuli J.C., and Beck J.S. Nature 359 (1992) 710
17. Li Y.B., Bando Y., Golberg D., and Uemura Y. Appl. Phys. Lett. 83 (2003) 3999
18. Han S., Li C., Liu Z.Q., Lei B., Zhang D.H., Jin W., Liu X.L., Tang T., and Zhou C.W. Nano. Lett. 4 (2004) 1241
19. Lauhon L.J., Gudiksen M.S., Wang D.L., and Lieber C.M. Nature 420 (2002) 57
20. Min B., Lee J.S., Hwang J.W., Keem K.H., Kang M.I., Cho K., Sung M.Y., Kim S., Lee M.-S., Park S.O., and Moon J.T. J. Cryst. Growth 252 (2003) 565
21. Pan A., Wang S., Liu R., Li C., and Zou B. Small 1 (2005) 1058
22. Meng X.-M., Hu J.-Q., Jiang Y., Lee C.-S., and Lee S.-T. Appl. Phys. Lett. 83 (2003) 2241
23. Dai L., Chen X.L., Zhang X., Zhou T., and Hu B. Appl. Phys. A 78 (2004) 557
24. Meng G.W., Zhang L.D., Mo C.M., Zhang S.Y., Qin Y., Feng S.P., and Li H.J. J. Mater. Res. 13 (1998) 2533
25. Bae S.Y., Seo H.W., Choi H.C., Han D.S., and Park J. J. Phys. Chem. B 109 (2005) 8496
26. Wang Y., Tang Z., Liang X., Liz-Marzan L.M., and Kotov N.A. Nano. Lett. 4 (2004) 225
27. Yin Y., Lu Y., Sun Y., and Xia Y. Nano. Lett. 2 (2002) 427
28. Obare S.O., Jana N.R., and Murphy C.J. Nano. Lett. 1 (2001) 601
29. Kim H.W., Kim N.H., Myung J.H., and Shim S.H. Phys. Stat. Sol. (a) 202 (2005) 1758
30. Yi L.X., Heitmann J., Scholz R., and Zacharias M. J. Phys. Condens. Matter 15 (2003) S2887
31. Hu J., Bando Y., Liu Q., and Golberg D. Adv. Funct. Mater. 13 (2003) 493
32. Cheng B., Russell J.M., Shi W., Zhang L., and Samulski E.T. J. Am. Chem. Soc. 126 (2004) 5972
33. Wu X.C., Song W.H., Wang K.Y., Hu T., Zhao B., Sun Y.P., and Du J.J. Chem. Phys. Lett. 336 (2001) 53
34. Lee K.H., Lee S.W., Vanfleet R.R., and Sigmund W. Chem. Phys. Lett. 376 (2003) 498
35. Nishikawa H., Shiroyama T., Nakamura R., Ohki Y., Nagasawa K., and Hama Y. Phys. Rev. B 45 (1992) 586
36. Yu D.P., Hang Q.L., Ding Y., Zhang H.Z., Bai Z.G., Wang J.J., Zou Y.H., Qian W., Xiong G.C., and Feng S.Q. Appl. Phys. Lett. 73 (1998) 3076
37. Kim T.W., Lee D.U., and Yoon Y.S. J. Appl. Phys. 88 (2000) 3759