Microstructural, electrical, and optical properties of SnO2 nanocrystalline thin films grown on InP (100) substrates for applications as gas sensor devices

Journal of Applied Physics

Volumn 88, Issue 6, 2000, Pages 3759-3761

  Kim, T W ^a   Lee, D U ^a   Yoon, Y S ^b  

^a Kwangwoon University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001672121     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1288021     Document Type: Article

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