Oxide-assisted growth and characterization of Ge/SiOx nanocables

Applied Physics Letters

Volumn 83, Issue 11, 2003, Pages 2241-2243

  Meng, Xiang Min ^a   Hu, Jun Qing ^a   Jiang, Yang ^a   Lee, Chun Sing ^a   Lee, Shuit Tong ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; EVAPORATION; GERMANIUM COMPOUNDS; MICROMETERS; POWDERS; SCANNING ELECTRON MICROSCOPY; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

CARRIER GASES;

NANOSTRUCTURED MATERIALS;

EID: 0142121583     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1609653     Document Type: Article

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