-
2
-
-
24644439334
-
-
Online. Available
-
J. J. McMahon et al., in Electron. Compon. Technol. Conf., 2005, pp. 331-336 Online. Available: http://www.rpi.edu/~luj/ RPI_3-D_Research_0504.pdf
-
(2005)
Electron. Compon. Technol. Conf
, pp. 331-336
-
-
McMahon, J.J.1
-
4
-
-
28344456237
-
3D chip stacking technology using through-chip interconnects
-
Nov
-
P. Benkaart, A. Keiser, A. Munding, M. Bschorr, H. J. Pfleiderer, E. Kohn, A. Heittmann, H. Huebner, and U. Ramacher, "3D chip stacking technology using through-chip interconnects," IEEE Des. Test., vol. 22, no. 6, pp. 512-518, Nov. 2005.
-
(2005)
IEEE Des. Test
, vol.22
, Issue.6
, pp. 512-518
-
-
Benkaart, P.1
Keiser, A.2
Munding, A.3
Bschorr, M.4
Pfleiderer, H.J.5
Kohn, E.6
Heittmann, A.7
Huebner, H.8
Ramacher, U.9
-
6
-
-
0035300622
-
-
K. Takahashi et al., Jpn. J. Appl. Phys., 40, no. 4B, pt. 1, pp. 3032-3037, 2001.
-
K. Takahashi et al., Jpn. J. Appl. Phys., vol. 40, no. 4B, pt. 1, pp. 3032-3037, 2001.
-
-
-
-
9
-
-
84948471389
-
Fabrication technologies for three-dimensional integrated circuits
-
San Jose, CA, Mar
-
R. Reif, A. Fan, C. Kuan-Neng, and S. Das, "Fabrication technologies for three-dimensional integrated circuits," in Proc. Int. Symp. Quality Electron. Design (ISQED'02), San Jose, CA, Mar. 2002, pp. 33-37.
-
(2002)
Proc. Int. Symp. Quality Electron. Design (ISQED'02)
, pp. 33-37
-
-
Reif, R.1
Fan, A.2
Kuan-Neng, C.3
Das, S.4
-
10
-
-
68949217830
-
Technologies enabling 3-D stacking of MEMS
-
presented at the, Munich, Germany, Oct. 1-2
-
M. M. V. Taklo, M. M. Mielnik, K. Schjølberg-Henriksen, P. Storås, H. Rosquist, N. Lietaer, and R. Johannessen, "Technologies enabling 3-D stacking of MEMS," presented at the IEEEWorkshop 3-D System Integration, Munich, Germany, Oct. 1-2, 2007.
-
(2007)
IEEEWorkshop 3-D System Integration
-
-
Taklo, M.M.V.1
Mielnik, M.M.2
Schjølberg-Henriksen, K.3
Storås, P.4
Rosquist, H.5
Lietaer, N.6
Johannessen, R.7
-
11
-
-
68949214482
-
-
B. Hochlowski, Low-cost wafer bumping using C4NP IBM, 2005, 18, Future Fab Intl. Online. Available: http://www.future-fab.com/ documents.asp?d_id=3041&=tried#
-
B. Hochlowski, Low-cost wafer bumping using C4NP IBM, 2005, vol. 18, Future Fab Intl. Online. Available: http://www.future-fab.com/ documents.asp?d_id=3041&=tried#
-
-
-
-
12
-
-
0035300622
-
Current status of research and development for three-dimensional chip stack technology
-
22001
-
K. Takahashi, H. Terao, Y. Tomita, Y. Yamaji, M. Hoshino, T. Sato, T. Morifuji, M. Sunohara, and M. Bonkohara, "Current status of research and development for three-dimensional chip stack technology," J. Appl. Phys., vol. 40, no. 22001, pp. 3032-3037.
-
J. Appl. Phys
, vol.40
, pp. 3032-3037
-
-
Takahashi, K.1
Terao, H.2
Tomita, Y.3
Yamaji, Y.4
Hoshino, M.5
Sato, T.6
Morifuji, T.7
Sunohara, M.8
Bonkohara, M.9
-
13
-
-
24644468680
-
Stencil printing technology for wafer level bumping at sub-100 micron pitch using Pb-free alloys
-
R. W. Kay, E. de Gourcuff, and M. P. Y. Desmulliez, "Stencil printing technology for wafer level bumping at sub-100 micron pitch using Pb-free alloys," in IEEE Electron. Compon. Technol. Conf., 2005, pp. 848-854.
-
(2005)
IEEE Electron. Compon. Technol. Conf
, pp. 848-854
-
-
Kay, R.W.1
de Gourcuff, E.2
Desmulliez, M.P.Y.3
-
14
-
-
35348911844
-
Cu/SnAg double bump flip chip assembly as an alternative of solder flip chip on organic substrates for fine pitch applications
-
H. Y. Son, G. J. Jung, J. K. Lee, J. Y. Choi, and K. W. Paik, "Cu/SnAg double bump flip chip assembly as an alternative of solder flip chip on organic substrates for fine pitch applications," in IEEE Electron. Compon. Technol. Conf., 2007, pp. 864-871.
-
(2007)
IEEE Electron. Compon. Technol. Conf
, pp. 864-871
-
-
Son, H.Y.1
Jung, G.J.2
Lee, J.K.3
Choi, J.Y.4
Paik, K.W.5
-
15
-
-
50049115805
-
Lead free micro bumping - Cost & yield challenges
-
K. Ruhmer, E. Hughlett, M. Ishizuka, T. Kojima, T. Asaka, B. Dang, S. Buchwalter, and D. Y. Shih, "Lead free micro bumping - Cost & yield challenges," in Proc. 9th Electron. Packag. Technol. Conf. 2007. EPTC 2007 Technol. Conf., pp. 331-337.
-
Proc. 9th Electron. Packag. Technol. Conf. 2007. EPTC 2007 Technol. Conf
, pp. 331-337
-
-
Ruhmer, K.1
Hughlett, E.2
Ishizuka, M.3
Kojima, T.4
Asaka, T.5
Dang, B.6
Buchwalter, S.7
Shih, D.Y.8
-
16
-
-
10444233506
-
Electrical characteristics of fine pitch chip solder joints fabricated using low temperature solders
-
U. B. Kang and Y. H. Kim, "Electrical characteristics of fine pitch chip solder joints fabricated using low temperature solders," in Proc. 54th. Electron. Compon. Technol. Conf., 2004, vol. 2, pp. 1952-1958.
-
(2004)
Proc. 54th. Electron. Compon. Technol. Conf
, vol.2
, pp. 1952-1958
-
-
Kang, U.B.1
Kim, Y.H.2
-
17
-
-
84875284687
-
ECD wafer bumping and packaging for pixel detector applications
-
T. Fritzsch, R. Jordan, O. Ehrmann, and H. Reichl, "ECD wafer bumping and packaging for pixel detector applications," in Proc. 16th Eur. Microelectron. Packag. Conf. EMPC 2007, pp. 122-127.
-
(2007)
Proc. 16th Eur. Microelectron. Packag. Conf. EMPC
, pp. 122-127
-
-
Fritzsch, T.1
Jordan, R.2
Ehrmann, O.3
Reichl, H.4
-
18
-
-
51249101107
-
Thermal cycling reliability of Cu/SnAg double-bump flip-chip assemblies for 100 um pitch applications
-
H. Y. Son, I. H. Kim, S. B. Lee, B. J. Park, and K. W. Paik, "Thermal cycling reliability of Cu/SnAg double-bump flip-chip assemblies for 100 um pitch applications," in Proc. Int. Conf. Electron. Materials Packag. EMAP 2007, pp. 1-7.
-
(2007)
Proc. Int. Conf. Electron. Materials Packag. EMAP
, pp. 1-7
-
-
Son, H.Y.1
Kim, I.H.2
Lee, S.B.3
Park, B.J.4
Paik, K.W.5
-
19
-
-
54949136866
-
A study on the thermal reliability of Cu/SnAg double-bump flip-chip assemblies on organic substrates
-
H. Y. Son, G. J. Jung, B. J. Park, and K. W. Paik, "A study on the thermal reliability of Cu/SnAg double-bump flip-chip assemblies on organic substrates," J. Electron. Materials, vol. 37, no. 12, pp. 1832-1842, 2008.
-
(2008)
J. Electron. Materials
, vol.37
, Issue.12
, pp. 1832-1842
-
-
Son, H.Y.1
Jung, G.J.2
Park, B.J.3
Paik, K.W.4
-
20
-
-
0003689862
-
Ag-Sn (Silver-Tin)
-
T. B. Massalski, Ed. Materials Park, OH: ASM International
-
I. Karakaya and W. T. Thompson, "Ag-Sn (Silver-Tin)," in Binary Alloy Phase Diagrams, T. B. Massalski, Ed. Materials Park, OH: ASM International, 1990, vol. 1, pp. 94-97.
-
(1990)
Binary Alloy Phase Diagrams
, vol.1
, pp. 94-97
-
-
Karakaya, I.1
Thompson, W.T.2
-
21
-
-
0036737497
-
Phase equilibria and solidification properties of Sn-Cu-Ni alloys
-
C.-H. Lin, S.-W. Chen, and C.-H. Wang, "Phase equilibria and solidification properties of Sn-Cu-Ni alloys," J. Electron. Materials, vol. 31, no. 9, pp. 907-915, 2002.
-
(2002)
J. Electron. Materials
, vol.31
, Issue.9
, pp. 907-915
-
-
Lin, C.-H.1
Chen, S.-W.2
Wang, C.-H.3
-
22
-
-
0037076832
-
Six cases of reliability study of Pb-free solder joints in electronic packaging technology
-
K. Zeng and K. N. Tu, "Six cases of reliability study of Pb-free solder joints in electronic packaging technology," Material Sci. Eng., vol. 38, no. 2, pp. 55-105, 2002.
-
(2002)
Material Sci. Eng
, vol.38
, Issue.2
, pp. 55-105
-
-
Zeng, K.1
Tu, K.N.2
-
23
-
-
10444263718
-
Qualification of SnAg solder bumps for lead-free flip chip applications
-
Jun. 1-4
-
B. Ebersberger, R. Bauer, and L. Alexa, "Qualification of SnAg solder bumps for lead-free flip chip applications," in Proc. 54th Electron. Compon. Technol. Conf., Jun. 1-4, 2004, vol. 1, pp. 683-691.
-
(2004)
Proc. 54th Electron. Compon. Technol. Conf
, vol.1
, pp. 683-691
-
-
Ebersberger, B.1
Bauer, R.2
Alexa, L.3
-
25
-
-
68949202952
-
-
R. J. Fields and S. R. Low, Physical and mechanical properties of intermetallic compounds commonly found in solder joints Metallurgy Division, Nat. Inst. Standards Technol, Gaithersburg, MD
-
R. J. Fields and S. R. Low, Physical and mechanical properties of intermetallic compounds commonly found in solder joints Metallurgy Division, Nat. Inst. Standards Technol., Gaithersburg, MD.
-
-
-
-
26
-
-
35648929907
-
Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu
-
W. Peng, E. Monlevade, and M. E. Marques, "Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu," Microelectron. Reliabil., vol. 47, pp. 2161-2168, 2007.
-
(2007)
Microelectron. Reliabil
, vol.47
, pp. 2161-2168
-
-
Peng, W.1
Monlevade, E.2
Marques, M.E.3
-
28
-
-
35348888344
-
Are intermetallics in solder joints really brittle
-
Reno, NV, May 29-Jun. 1
-
C. C. Lee, P. J. Wang, and J. S. Kim, "Are intermetallics in solder joints really brittle," in The Proceedings of the 57th. Electronic Components and Technology Conference, Reno, NV, May 29-Jun. 1 2007, pp. 648-652.
-
(2007)
The Proceedings of the 57th. Electronic Components and Technology Conference
, pp. 648-652
-
-
Lee, C.C.1
Wang, P.J.2
Kim, J.S.3
-
29
-
-
33845716823
-
Electromigration issues in lead-free solder joints
-
C. Chen and S. W. Liang, "Electromigration issues in lead-free solder joints," J. Matr. Sci., vol. 18, pp. 259-268, 2007.
-
(2007)
J. Matr. Sci
, vol.18
, pp. 259-268
-
-
Chen, C.1
Liang, S.W.2
-
30
-
-
33845309607
-
Solid state diffusion in Cu-Sn and Ni-Sn diffusion couples with flip-scale dimension
-
R. Labie, W. Ruythooren, and J. V. Mumbeeck, "Solid state diffusion in Cu-Sn and Ni-Sn diffusion couples with flip-scale dimension," Intermetallics, vol. 15, pp. 396-403, 2007.
-
(2007)
Intermetallics
, vol.15
, pp. 396-403
-
-
Labie, R.1
Ruythooren, W.2
Mumbeeck, J.V.3
|