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Volumn 2, Issue , 2004, Pages 1952-1958

Electrical characteristics of fine pitch flip chip solder joints fabricated using low temperature solders

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; EPOXY RESINS; ETCHING; EUTECTICS; FABRICATION; INTERMETALLICS; LIQUID CRYSTAL DISPLAYS; LOW TEMPERATURE ENGINEERING; MAGNETRON SPUTTERING; PHOTOLITHOGRAPHY; SOLDERING; THERMAL CYCLING;

EID: 10444233506     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (10)
  • 1
    • 0032093924 scopus 로고    scopus 로고
    • Overview of conductive adhesive interconnection technologies for LCD's
    • Helge Kristiansen and Johan Liu, "Overview of Conductive Adhesive Interconnection Technologies for LCD's," IEEE Trans-CPMT-A, Vol. 21, No. 2 (1998), pp. 208-214.
    • (1998) IEEE Trans-CPMT-A , vol.21 , Issue.2 , pp. 208-214
    • Kristiansen, H.1    Liu, J.2
  • 2
    • 0032093992 scopus 로고    scopus 로고
    • Chip on glass-interconnect for row/column driver packaging
    • Rajeev Joshi, "Chip on glass-interconnect for row/column driver packaging," Microelectr. J., Vol. 29 (1998), pp. 343-349.
    • (1998) Microelectr. J. , vol.29 , pp. 343-349
    • Joshi, R.1
  • 3
    • 10444287200 scopus 로고    scopus 로고
    • A new COG technique using low temperature solder bumps for LCD driver IC packaging applications
    • accepted
    • U.-B. Kang and Y.-H. Kim, "A New COG Technique Using Low Temperature Solder Bumps for LCD Driver IC Packaging Applications," IEEE Trans-CPMT-A, accepted.
    • IEEE Trans-CPMT-A
    • Kang, U.-B.1    Kim, Y.-H.2
  • 4
    • 0004039716 scopus 로고
    • McGraw-Hill (New York)
    • J. H. Lau, Flip Chip Technologies, McGraw-Hill (New York, 1995), pp. 123-153.
    • (1995) Flip Chip Technologies , pp. 123-153
    • Lau, J.H.1
  • 6
    • 0742303041 scopus 로고    scopus 로고
    • The microstructure characterization of ultra-small eutectic Bi-Sn solder bumps on Au/Cu/Ti and Au/Ni/Ti under-bump metallization
    • U.-B. Kang and Y.-H Kim, "The Microstructure Characterization of Ultra-Small Eutectic Bi-Sn Solder Bumps on Au/Cu/Ti and Au/Ni/Ti Under-Bump Metallization," J. Electr. Mater.Vol. 33, No. 1 (2004), pp. 61-69.
    • (2004) J. Electr. Mater. , vol.33 , Issue.1 , pp. 61-69
    • Kang, U.-B.1    Kim, Y.-H.2
  • 7
    • 0037381421 scopus 로고    scopus 로고
    • The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications
    • C.Y. Yin, M.O. Alam, Y.C. Chan, C. Bailey, and Hua Lu, "The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications," Microelectron. Reliab., Vol. 43, (2003), pp. 625-633.
    • (2003) Microelectron. Reliab. , vol.43 , pp. 625-633
    • Yin, C.Y.1    Alam, M.O.2    Chan, Y.C.3    Bailey, C.4    Lu, H.5
  • 8
    • 0342503465 scopus 로고
    • Brandis and Brook, Butterworth-Heinemann
    • Smithells Metals Reference Book. 7th edn, Brandis and Brook, Butterworth-Heinemann, (1992), pp. 14-1-2.
    • (1992) Smithells Metals Reference Book. 7th Edn


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.