Monitoring and mapping imperfections in silane-Based self-Assembled monolayers by chemical amplification

Langmuir

Volumn 25, Issue 16, 2009, Pages 9078-9084

  Jalali, Hanifa ^a   Gates, Byron D ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MOLECULES; SILANES;

ATOMIC-FORCE-MICROSCOPY; CHEMICAL AMPLIFICATION; LIMIT OF DETECTION; MICROSCOPY TECHNIQUE; MOLECULAR SCALE; REPRODUCIBILITIES; SCALE PROPERTIES; SIMPLE METHOD; SIMPLE++; SURFACE-MODIFICATION;

SELF ASSEMBLED MONOLAYERS;

SILANE DERIVATIVE; SILVER NITRATE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; GENETIC PROCEDURES; METHODOLOGY; NANOTECHNOLOGY; SURFACE PROPERTY;

BIOSENSING TECHNIQUES; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; SILANES; SILVER NITRATE; SURFACE PROPERTIES;

EID: 68649117447     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la900443c     Document Type: Article

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