Method for reliable measurement of relative frictional properties of different self-assembled monolayers using frictional force microscopy

Thin Solid Films

Volumn 382, Issue 1-2, 2001, Pages 202-213

  Moser, A E ^a   Eckhardt, C J ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMISORPTION; FRICTION; SILICA; TRIBOLOGY;

SELF ASSEMBLY; SELF-ASSEMBLED MONOLAYERS;

MONOLAYERS;

EID: 0034829817     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01681-3     Document Type: Article

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