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Volumn 9, Issue 7, 2005, Pages 512-519

Mapping of defects in self-assembled monolayers by polymer decoration

(3) Losic, Dusan a Shapter, Joe G a Gooding, J Justin b

b UNIVERSITY OF NEW SOUTH WALES (Australia)

Author keywords

Atomic force microscopy; Defects; Electrochemical polymerisation; Polytyramine; Scanning tunnelling microscopy; Self assembled monolayers

Indexed keywords

ATOMIC FORCE MICROSCOPY; DECORATION; ELECTRODEPOSITION; ELECTROPOLYMERIZATION; INFRARED SPECTROSCOPY; MAPPING; PARTICLE SIZE ANALYSIS; POLYMERS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

DEFECT DENSITY; MICROCONTACT PRINTING; POLYTYRAMINE; SPATIAL DISTRIBUTION;

CRYSTAL DEFECTS;

EID: 23844544167 PISSN: 14328488 EISSN: None Source Type: Journal
DOI: 10.1007/s10008-004-0614-x Document Type: Article

Times cited : (14)

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