Resolving the Burgers vector for individual GaN dislocations by electron channeling contrast imaging

Scripta Materialia

Volumn 61, Issue 8, 2009, Pages 773-776

  Picard, Y N ^a   Twigg, M E ^a   Caldwell, J D ^a   Eddy Jr , C R ^a   Mastro, M A ^a   Holm, R T ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Chemical vapor deposition (CVD); Dislocations; Electron channeling contrast imaging (ECCI); Nitrides; Scanning electron microscopy (SEM)

Indexed keywords

ATOMIC STEP; DISLOCATION TYPE; DISLOCATIONS; DYNAMICAL DIFFRACTION; ELECTRON CHANNELING CONTRAST IMAGING (ECCI); ELECTRON CHANNELING CONTRASTS; ELECTRON INTENSITY; LOW ANGLE GRAIN BOUNDARIES; NON DESTRUCTIVE; SCANNING ELECTRON MICROSCOPE; SPATIAL PROFILES; THREADING DISLOCATION;

BURGERS VECTOR; ELECTRON MICROSCOPES; ELECTRONS; GALLIUM ALLOYS; GALLIUM NITRIDE; GRAIN BOUNDARIES; SCANNING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM; VAPORS;

CHEMICAL VAPOR DEPOSITION;

EID: 68349121672     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2009.06.021     Document Type: Article

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