Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast

Microscopy Research and Technique

Volumn 69, Issue 5, 2006, Pages 374-381

  Crimp, Martin A ^a  

^a Michigan State University   (United States)

Author keywords

Contrast analysis; Dislocation density; ECCI; SEM; Twins

Indexed keywords

DEFECTS; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

BULK MATERIALS; CONTRAST ANALYSE; DIFFRACTION-CONTRAST IMAGING; DISLOCATIONS DENSITIES; ELECTRON CHANNELING CONTRASTS; ELECTRON CHANNELLING CONTRAST IMAGING; MICROSCOPY IMAGING; SAMPLE PREPARATION; THIN FOIL; TWIN;

SCANNING ELECTRON MICROSCOPY;

TITANIUM;

ARTICLE; CONTRAST; CRYSTAL STRUCTURE; ELECTRON; FOIL; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33646725986     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20293     Document Type: Article

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