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Volumn 90, Issue 23, 2007, Pages

Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER MOBILITY; CRYSTALLINE MATERIALS; DISLOCATIONS (CRYSTALS); EPITAXIAL FILMS; FILM GROWTH;

EID: 34250743630     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2746075     Document Type: Article
Times cited : (49)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.