Raman scattering studies of Ar+ implanted CdS films prepared by vacuum evaporation

Physica Status Solidi (A) Applied Research

Volumn 164, Issue 2, 1997, Pages 725-732

  Narayanan, K L ^a   Vijayakumar, K P ^a   Nair, K G M ^b   Kesavamoorthy, R ^b  

^a Department of Physics   (India)

^b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; EVAPORATION; FILM PREPARATION; GLASS; ION IMPLANTATION; RAMAN SCATTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

FULL WIDTH AT HALF MAXIMUM (FWHM); MASS ANALYZED BEAMS; VACUUM EVAPORATION;

CADMIUM ALLOYS;

EID: 0031383469     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199712)164:2<725::AID-PSSA725>3.0.CO;2-J     Document Type: Article

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