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Volumn 107, Issue 1-4, 1996, Pages 246-249
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Experimental study by "in situ" resistivity measurements of swift heavy ion induced defects in GaAs crystals
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000515359
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-583X(95)01146-3 Document Type: Article |
Times cited : (30)
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References (14)
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