Structural and elastic properties of Cu6Sn5 and Cu3Sn from first-principles calculations

Journal of Materials Research

Volumn 24, Issue 7, 2009, Pages 2361-2372

  Chen, Jiunn ^a,b   Li, Yi Shao ^c   Yang, Ping Feng ^c   Ren, Chung Yuan ^a   Huang, Di Jing ^d  

^a ADVANCED SEMICONDUCTOR ENGINEERING INC   (Taiwan)

^b NATIONAL PINGTUNG UNIVERSITY   (Taiwan)

^c NATIONAL KAOHSIUNG NORMAL UNIVERSITY   (Taiwan)

^d NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LATTICE; CRYSTALLINE PHASIS; DATA ANALYSIS; ELASTIC ANISOTROPY; ELASTIC PROPERTIES; ELASTIC STIFFNESS; FIRST-PRINCIPLES CALCULATION; IN-PLANE; INTRINSIC HARDNESS; LATTICE MODULATIONS; MICROELECTRONIC PACKAGING; MICROSTRUCTURE EFFECTS; NANOINDENTATION EXPERIMENTS; NANOINDENTATION TESTS; POLYCRYSTALLINE; STRAIN-ENERGY; TIN-COPPER;

ANISOTROPY; ELASTICITY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; EXPERIMENTS; HARDNESS; LITHIUM BATTERIES; MICROELECTRONICS; NANOINDENTATION; SOLID STATE PHYSICS; STIFFNESS; TIN;

ELASTIC MODULI;

EID: 68149091611     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0273     Document Type: Article

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