Choose-your-own-adventure routing: Lightweight load-time defect avoidance

Proceedings of the 7th ACM SIGDA International Symposium on Field-Programmable Gate Arrays, FPGA'09

Volumn , Issue , 2009, Pages 23-32

  Rubin, Raphael ^a   DeHon, André ^b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

Algorithms; Alternatives; Bitstream load; Defect tolerance; Design; Experimentation; In field repair; Programmable interconnect; Reliability

Indexed keywords

ALTERNATIVES; BITSTREAM LOAD; DEFECT TOLERANCE; EXPERIMENTATION; IN-FIELD REPAIR; PROGRAMMABLE INTERCONNECT;

COMPUTER AIDED DESIGN; DEFECTS; LOAD TESTING; LOGIC GATES;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 67650705068     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1508128.1508133     Document Type: Conference Paper

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