Toward increasing FPGA lifetime

IEEE Transactions on Dependable and Secure Computing

Volumn 5, Issue 2, 2008, Pages 115-126

  Srinivasan, Suresh ^a,b   Krishnan, Ramakrishnan ^a,b   Mangalagiri, Prasanth ^a,b   Xie, Yuan ^a,b   Narayanan, Vijaykrishnan ^a,b   Irwin, Mary Jane ^a,b   Sarpatwari, Karthik ^a,b  

^a IEEE

^b The Pennsylvania State University   (United States)

Author keywords

Electro migration; FPGA; Hot carrier effects; Negative bias temperature instability; Time dependent dielectric breakdown

Indexed keywords

ELECTRIC BREAKDOWN; ELECTROMIGRATION; HOT CARRIERS; THERMAL EFFECTS;

NEGATIVE BIAS TEMPERATURE INSTABILITY; TIME-DEPENDENT DIELECTRIC BREAKDOWN;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 43649083559     PISSN: 15455971     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDSC.2007.70235     Document Type: Article

References (28)

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