Reconfiguration and fine-grained redundancy for fault tolerance in FPGAS

Proceedings - 2006 International Conference on Field Programmable Logic and Applications, FPL

Volumn , Issue , 2006, Pages 455-460

  Campregher, Nicola ^a   Cheung, Peter Y K ^a   Constantinides, George A ^a   Vasilko, Milan ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b BOURNEMOUTH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT TOLERANCE; FUZZY LOGIC; INTEGER PROGRAMMING; LINEAR PROGRAMMING; LINEARIZATION; RELIABILITY;

DEEP SUB-MICRON (DSM); FIELD PROGRAMMABLE LOGIC (FPL); FUNCTIONAL FAULTS; INTERCONNECT RESOURCES; INTERNATIONAL CONFERENCES; MANUFACTURING TECHNOLOGIES; MINIMAL AREA; PHYSICAL DEFECTS; WAFER YIELDS; YIELD ENHANCEMENT; YIELD IMPROVEMENTS;

QUALITY ASSURANCE;

EID: 46249102184     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FPL.2006.311251     Document Type: Conference Paper

References (14)

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