Synchrotron X-ray and ab initio studies of β-Si3N 4

Acta Crystallographica Section B: Structural Science

Volumn 60, Issue 4, 2004, Pages 388-405

  Du Boulay, D ^a   Ishizawa, N ^a   Atake, T ^b   Streltsov, V ^c   Furuya, K ^d   Munakata, F ^e  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c CSIRO   (Australia)

^d Organic Materials General Division   (Japan)

^e YOKOHAMA NATIONAL UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; DATA ACQUISITION; MATHEMATICAL MODELS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

SINGLE-CRYSTAL SYNCHROTRON X-RAY DIFFRACTION DATA;

SILICON NITRIDE;

EID: 27944463485     PISSN: 01087681     EISSN: None     Source Type: Journal    
DOI: 10.1107/S010876810401393X     Document Type: Article

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