Bayesian inference model for step-stress accelerated life testing with type-II censoring

Proceedings - Annual Reliability and Maintainability Symposium

Volumn , Issue , 2008, Pages

  Lee, Jinsuk ^a   Pan, Rong ^a  

^a Arizona State University   (United States)

Author keywords

Bayesian inference; Conjugate prior; Siegel gamma distribution; Step stress ALT; Type II censoring

Indexed keywords

BAYESIAN INFERENCE; CONJUGATE PRIOR; SIEGEL-GAMMA DISTRIBUTION; STEP-STRESS ALT; TYPE-II CENSORING;

BAYESIAN NETWORKS; INFERENCE ENGINES; KNOWLEDGE ENGINEERING; MAINTAINABILITY; RANDOM ACCESS STORAGE; STRESS ANALYSIS;

STATISTICAL TESTS;

EID: 67650302043     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2008.4925776     Document Type: Conference Paper

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