Commentary: Inference in simple step-stress models

IEEE Transactions on Reliability

Volumn 50, Issue 1, 2001, Pages 36-37

  Watkins, A J ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Accelerated life testing; Exponential distribution; Lack of memory; Step stress; Type II censoring

Indexed keywords

FAILURE ANALYSIS; MATHEMATICAL MODELS; PROBABILITY DISTRIBUTIONS; STRESS ANALYSIS;

ACCELERATED LIFE TESTING; EXPONENTIAL DISTRIBUTION; STEP-STRESS MODELS;

RELIABILITY;

EID: 0035265698     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.935014     Document Type: Note

References (3)

1. Inferences on a simple step-stress model with type-II censored exponential data
2. Optimum simple step-stress accelerated life test with censoring
3. Optimum simple step-stress plans for accelerated life testing