A bayes approach to step-stress accelerated life testing

IEEE Transactions on Reliability

Volumn 45, Issue 3, 1996, Pages 491-498

  Van Rene Dorp J ^a,b,c,d   Mazzuchi, Thomas A ^a,c   Fornell, Gordon E ^b,d   Pollock, Lee R ^a,c  

^a GEORGE WASHINGTON UNIVERSITY   (United States)

^b George University   (United States)

^c Air Force Materiel Command   (United States)

^d USAF Electronic Systems Center

Author keywords

Environmental testing; Ordered dirichlet distribution; Overstress testing

Indexed keywords

ENVIRONMENTAL TESTING; FAILURE ANALYSIS; PROBABILITY; STATISTICAL METHODS;

ORDERED DIRICHLET DISTRIBUTION; OVERSTRESS TESTING; STEP STRESS ACCELERATED LIFE TESTING;

RELIABILITY;

EID: 0030245467     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.537021     Document Type: Article

References (19)

1. L.R. Pollock, A Wide-Parametric, Btiyesian Methodology for System-Level Step-Stress Accelerated Life Testing, Dissertation 1989; Florida Institute of Technology.
2. T.A. Mazzuchi, N.D. Singpurwalla, "Inference from accelerated life tests: Some recent results", [19: pp 181-192].
3. W. Nelson, "Accelerated life testing: Step-stress models and data analysis", IEEE Trans. Reliability, vol R-29, 1980 Jun, pp 103-108.
4. M.H. DeGroot, P.K. Goel, "Bayesian estimation and optimal designs in partially accelerated life testing", Naval Research lagistics Quarterly, vol 26, 1979 May, pp 223-235.
5. R. Miller, W. Nelson, "Optimum simple step-stress plans for accelerated life testing", IEEE Trans. Reliability, vol R-32, 1983 Apr, pp 59-65.
6. M. Shaked, N.D. Singpurwalla, "Inference for step-stress accelerated life tests", J. Statistical Planning & Inference, vol 7, 1983 Jun, pp 295-306.
7. G. luculano, A. Zanini, "The evaluation of failure models through stepstress tests", IEEE Trans. Reliability, vol 35, 1986 Oct, pp 409-413.
8. M.H. DeGroot, P.K. Goel, "Bayesian design and analysis of accelerated life testing with step-stress", [19: pp 193-202].
9. D.S. Bai, M.S. Kim, S.H. Lee, "Optimum simple step-stress accelerated life tests with censoring", IEEE Trans. Reliability, vol 38, 1989 Dec, pp 528-532.
10. H.F. Martz, R.A. Waller, Bayesian Reliability Analysis, 1982; John Wiley & Sons.
11. L. Hart, "Reliability of modified designs: A Bayes analysis of an accelerated test of electronic assemblies", IEEE Trans. Reliability, vol 39. 1990 Jun, pp 140-144.
12. D. Kececioglu, J. Jacks, "The Arrhenius, Eyring, Inverse Power Law, and combination models in accelerated life testing", Reliability Engineering, vol 8, 1984, pp 1-9.
13. N.R. Mann, R.E. Schafer, N.D. Singpurwalla, Methods for Statistical Analysis of Reliability and Life Data, 1974; John Wiley & Sons.
14. R.M. Cooke, Experts in Uncertainty, 1991; Oxford University Press.
15. W.H. Press, etal, Numerical Recipes in Pascal, 1989; Cambridge University Press.
16. J.E. Angus, "Notes and results from the study of the wide-parametric Bayesian methodology for system level, step-stress accelerated life testing", Internal Report, 1990; Hughes Aircraft Company.
17. R.H. Lochner, "A generalized Dirichlet distribution in Bayesian testing", J. Royal Statistical Society Series B, vol 37, 1975, pp 103-113.
18. J.R. van Dorp, T.A. Mazzuchi, L.R. Pollock, SMART1.4 UserManual, Technical Report 1994; The Institute for Reliability and Risk Analysis, The George Washington University.
19. Proc. S.I.P. Course CII, Accelerated Life Testing and Experts ' Opinion in Reliability, (C.A. Clarotti, D.V. Lindley, Eds), 1988; North Holland,