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Volumn 367, Issue 1897, 2009, Pages 2573-2584

Enabling cutting-edge semiconductor simulation through grid technology

Author keywords

Nano complementary metal oxide semiconductor electronics; virtual organization; Security; Variability

Indexed keywords

METALLIC COMPOUNDS; MOS DEVICES; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 67650293318     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.2009.0031     Document Type: Article
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.