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Volumn 113, Issue 23, 2009, Pages 10206-10214

Role of etching in aqueous oxidation of hydrogen-terminated Si(100)

Author keywords

[No Author keywords available]

Indexed keywords

AQUEOUS OXIDATION; ETCHING PROCESS; FREE WATER; INITIAL PHASIS; ISOTOPIC LABELING; OXIDATION OF HYDROGEN; OXIDE GROWTH; SI(1 0 0); SOLUTION PH; SURFACE ETCHING; SURFACE INFRARED SPECTROSCOPY; SURFACE OXIDATIONS; ULTRA-PURE WATER; VIBRATIONAL MODES;

EID: 67649986558     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp8114989     Document Type: Article
Times cited : (8)

References (43)
  • 10
    • 67649959943 scopus 로고    scopus 로고
    • Oxidation of these samples was kindly performed by Ian Clark and Melissa Hines at the Cornell NanoScale Facility
    • Oxidation of these samples was kindly performed by Ian Clark and Melissa Hines at the Cornell NanoScale Facility.
  • 27
  • 31
    • 84869347246 scopus 로고    scopus 로고
    • 2O.
    • 2O.
  • 33
    • 84869354093 scopus 로고    scopus 로고
    • While some of the decrease in ν (SiHx) intensity arises from oxidation at neutral pH, comparison with the analogous experiment in H 2O shows that etching, as opposed to oxidation, accounts for around 80% of the SiHx loss during oxidation in neutral D2O
    • 2O.
  • 37
    • 84869368159 scopus 로고    scopus 로고
    • -1 for the UHV surface is an Si-H bending mode on the oxidized surface, which grows in because H atoms do not fully desorb from oxidized regions of the surface under the experimental conditions used.
    • -1 for the UHV surface is an Si-H bending mode on the oxidized surface, which grows in because H atoms do not fully desorb from oxidized regions of the surface under the experimental conditions used.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.