Tracing the definition of the kilogram to the Avogadro constant using a silicon single crystal

Metrologia

Volumn 40, Issue 6, 2003, Pages 366-375

  Becker, Peter ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (SPECIFIC GRAVITY); MEASUREMENT ERRORS; METRIC SYSTEM; MOLECULAR WEIGHT; SILICON; SINGLE CRYSTALS; STANDARDS;

AVOGADRO CONSTANTS; UNCERTAINTY ESTIMATION;

WEIGHING;

EID: 0347506391     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/6/008     Document Type: Article

References (47)

1. Avogadro A 1811 J. Phys. Paris 73 56-76
2. Loschmidt J 1865 Sitzungsber. Kais. Akad. D. Wiss. (Wien) 395-407
3. Perrin J 1909 C.R. Acad. Sci. (Paris) 149 477-9 Perrin J 1911 C.R. Acad. Sci. (Paris) 152 1380-2
4. Perrin J 1909 C.R. Acad. Sci. (Paris) 149 477-9 Perrin J 1911 C.R. Acad. Sci. (Paris) 152 1380-2
5. Millikan R A 1908 Phys. Rev. 26 197-8
6. Rutherford E and Geiger H 1909 Phys. Zeits. 10 1-6
7. DuNouy P L 1924 Science 59 580-2
8. Bragg W H 1913 Proc. R. Soc. A 88 428-38
9. Bearden J A 1931 Phys. Rev. 37 1210-29
10. Bonse U and Hart M 1965 Appl. Phys. Lett. 6 155-6
11. De Bièvre P et al 2001 IEEE Trans. Instrum. Meas. 50 593-7
12. Becker P 2001 Metrologia 38 85-6
13. Virgo S E 1932 Sci. Progr. 27 634-49
14. Deslattes R D 1980 Ann. Rev. Phys. Chem. 31 435-61
15. Mathieu J P 1984 Cahiers d'histoire et philosophie des sciences 9 1-109
16. Mana O and Zosi G 1995 Rev Nuovo Cimento 18 1-23
17. Becker P 2001 Rep. Prag. Phys. 64 1945-2008
18. Zulehner W, Neuer B and Rau G 1993 Ullmann's Encyclopedia of Industrial Chemistry A 23 721-48
19. Zulehner W 1991 Landolt-Börnstein New Series vol III/22b, ed K H Hellwege and O Madelung (Berlin: Springer) pp 391-3
20. Krause-Rehberg R, Leipner H S, Kupsch A, Polity A and Drost T 1994 Phys. Rev. B 49 2385-95
21. Knowlton W B, Walton J T, Lee J S, Wong Y K, Haller E E, von Ammon W and Zulehner W 1995 Mater. Sci. Forum 201 1761-5
22. Lemke H and Zulehner W 1999 Physica B 273-274 398-403
23. Gebauer J, Rudolf F, Polity A, Krause-Rehberg R, Martin J and Becker P 1999 Appl. Phys. A 68 411-16
24. Vegard L 1921 Z. Phys. 5 17-25
25. Scheffler M and Dabrowski J 1988 Phil. Mag. A 58 107-15
26. Becker P, Kuetgens U, Stümpel J, Biernacki S and Scheffler M 1995 PTB-Mitt. 105 95-8
27. Deslattes R D, Henins A, Bowman H A, Schoonover R M, Carroll C L, Barnes I L, Machlan L A, Moore L A and Shields W R 1974 Phys. Rev. Lett. 33 463-6
28. Seyfried P et al 1992 Z. Phys. B 87 289-98
29. Basile G and Bergamin A, Cavagnero G and Mana G 1994 Phys. Rev. Lett. 72 3133-6
30. Fujimoto H, Tanaka M and Nakayama K 1995 IEEE Trans. Instrum. Meas. 44 471-4
31. De Bièvre P, Valkiers S, Peiser H S, Schaefer F and Seyfried P 1994 PTB-Mitt. 104 225-36
32. De Bièvre P, Lenaers G, Murphy T J, Peiser H S and Valkiers S 1995 Metrologia 32 103-10
33. De Bièvre P and Valkiers S 1994 Metrologia 31 245-9
34. Gonfiantini R, De Bièvre P, Valkiers S and Taylor P D P 1997 IEEE Trans. Instrum. Meas. 46 566-71
35. Gonfiantini R 1996 Laboratory Report Institute for Reference Materials and Measurements, Geel, Belgium
36. De Bièvre P, Valkiers S, Peiser S, Becker P, Lüdicke F, Spieweck F and Stümpel J 1995 IEEE Trans. Instrum. Meas. 44 530-2
37. Leistner A J and Giardini W J 1995 Metrologia 31 231-5
38. Saunders J B 1972 J. Res. Natl Bur. Stand. C 76 11-20
39. Sacconi A, Peuto A, Pasin W, Panciera R, Lenaers G, Valkiers S, Van den Berg W De and Bièvre P 1989 IEEE Trans. Instrum. Meas. 38 200-5
40. Kozdon A, Wagenbreth H and Hoburg D 1990 PTB-Report W-43, Physikalisch-Technische Bundesanstalt Braunschweig
41. Fujii K and Waseda A 2002 Laboratory Report
42. Bettin H 2003 private communication
43. De Bièvre P et al 2001 IEEE Trans. Instrum. Meas. 50 593-7
44. Mohr P J and Taylor B N 2000 Rev. Mod. Phys. 72 351-495
45. Becker P 2001 Metrologia 38 85-6
46. Di Filippo F, Natarajan V, Boyce K R and Pritchard D E 1994 Phys. Rev. Lett. 73 1481-4
47. Kenny M J, De Bièvre P and Picard A 2003 IEEE Trans. Instrum. Meas. 52 641-5