Materials characterization using high-resolution scanning-electron microscopy and x-ray microanalysis

JOM

Volumn 58, Issue 3, 2006, Pages 20-26

  Gauvin, Raynald ^a   Robertson, Kevin ^a   Horny, Paula ^a   Elwazri, Adbelbaset M ^a   Yue, Steve ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY; LOW VOLTAGE MICROSCOPY; X RAY MICROANALYSIS;

CARBON NANOTUBES; CHARACTERIZATION; ELECTRON BEAMS; ELECTRON OPTICS; MICROANALYSIS; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SUPERLATTICES; X RAY ANALYSIS;

MATERIALS SCIENCE;

EID: 33645122372     PISSN: 10474838     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11837-006-0155-0     Document Type: Review

References (9)

1. D.C. Joy, "The Theory and Practice of High-Resolution Scanning Electron Microscopy," Ultramicroscopy, 37 (1991), pp. 216-233.
2. D.C. Joy and C.S. Joy, "Low Voltage Scanning Electron Microscopy," Micron, 27 (1996), pp. 247-263.
3. P. Hovington, D. Drouin, and R. Gauvin, "Casino: A New Era of Monte Carlo Code in C Language for Electron Beam Interaction, Part I: Description of the Program," Scanning, 19 (1) (1997), pp. 1-14;. Casino can be downloaded at www.montecarlomodeling.mcgill.ca.
4. D.C. Joy, C.S. Joy, and R.D. Bunn, "Measuring the Performance of Scanning Electron Microscope Detectors," Scanning, 18 (6) (1996), pp. 533-538.
5. E.D. Boyes, "On Low Voltage Scanning Electron Microscopy and Chemical Microanalysis," Microscopy and Microanalysis, 6 (2000), pp. 307-316.
6. D.E. Newbury, "Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy," J. Research of the National Institute of Standards and Technology, 107 (6) (2002), pp. 605-619.
7. J.I. Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis (NewYork: Kluwer Academic, 2003).
8. P. Horny, R. Gauvin, and E. Lifshin, "An Extension of the Cliff-Lorimer Technique for Quantitative X-Ray Microanalysis in the Field Emission Scanning Electron Microscope," submitted to Microscopy and Microanalysis (2006).
9. R. Gauvin et al., "Win X-Ray, A New Monte Carlo Program to Simulate the Complete EDS X-Ray Spectrum in the SEM," Microscopy and Microanalysis, 12 (2006), pp. 1-16. Win X-Ray can be downloaded at www.montecarlomodeling.mcgill.ca.